Measurement for back-reflection of photonic crystal fiber fusion splicing point based on low-coherence light
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摘要:
光子晶体光纤（PCF）与传统单模光纤熔接时斜切熔接可以大大减小熔点处反射，但是仍然存在微弱的残余背向反射，为了精确测量该残余背向反射大小，本文基于低相干光干涉测量原理提出了一种Mach-Zehnder与Michelson混合型干涉仪。基于该干涉仪，对包层直径125 μm实芯光子晶体光纤与传统单模光纤斜8°熔点，以及包层直径100 μm实芯光子晶体光纤与传统单模光纤斜8°熔点处的背向反射进行了测量，得到背向反射率分别为-52.12 dB和-49.35 dB，并获得了熔点的位置信息。该干涉仪为光子晶体光纤斜切熔点残余背向反射的精确定位和测量提供了工具和手段，为熔点质量的改善奠定了基础。
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关键词:
- 光子晶体光纤（PCF） /
- 斜切熔接 /
- 背向反射 /
- 低相干光 /
- 干涉测量
Abstract:Although angle-cleaved fusion splice can greatly reduce the reflection of the fusion splicing point between photonic crystal fiber (PCF) and conventional single mode fiber, a weak residual back-reflection still exists at the fusion splicing point. A Mach-Zehnder and Michelson hybrid interferometer based on the principle of low-coherence interferometry was designed to achieve accurate positioning measurement of the residual back-reflection.Utilizing the interferometer, a -52.12 dB back reflectance of the 8° oblique splicing point between 125 μm cladding diameter solid-core PCF and conventional single mode fiber and a -49.35 dB back reflectance of the 8° oblique splicing point between 100 μm cladding diameter solid-core PCF and conventional single mode fiber were obtained.The locations of the two fusion splicing points were also acquired. The interferometer provides tools and means for precise positioning and measurement of the residual back-reflection of PCF angle-cleaved fusion splicing point, and lays a foundation for the quality improvement of the fusion splicing point.
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图 1 熔点背向反射的传统测量方法
Figure 1. Traditional measurement method of fusion splicing point back-reflection
图 2 空芯光子晶体光纤与传统单模光纤熔点的侧视图
Figure 2. Side view of fusion splicing points of HC-PCF and conventional SMF
图 3 光纤背向反射测试装置原理
Figure 3. Schematic of test setup for fiber back-reflection measurements
图 5 多个反射点的定位测量示意图
Figure 5. Schematic of positioning measurement of multiple reflection points
图 8 实芯光子晶体光纤与传统单模光纤斜切熔点侧视图及相应的背向反射测量结果
Figure 8. Side view of angle-cleaved fusion splicing points of SC-PCF and conventional SMF and their back-reflection measurement results
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