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随机粗糙面的双站散射模型分析

陈锟山 李召良 刘玉

陈锟山, 李召良, 刘玉等 . 随机粗糙面的双站散射模型分析[J]. 北京航空航天大学学报, 2015, 41(10): 1765-1776. doi: 10.13700/j.bh.1001-5965.2015.0205
引用本文: 陈锟山, 李召良, 刘玉等 . 随机粗糙面的双站散射模型分析[J]. 北京航空航天大学学报, 2015, 41(10): 1765-1776. doi: 10.13700/j.bh.1001-5965.2015.0205
CHEN Kunshan, LI Zhaoliang, LIU Yuet al. Model analysis of bistatic scattering from randomly rough surfaces[J]. Journal of Beijing University of Aeronautics and Astronautics, 2015, 41(10): 1765-1776. doi: 10.13700/j.bh.1001-5965.2015.0205(in Chinese)
Citation: CHEN Kunshan, LI Zhaoliang, LIU Yuet al. Model analysis of bistatic scattering from randomly rough surfaces[J]. Journal of Beijing University of Aeronautics and Astronautics, 2015, 41(10): 1765-1776. doi: 10.13700/j.bh.1001-5965.2015.0205(in Chinese)

随机粗糙面的双站散射模型分析

doi: 10.13700/j.bh.1001-5965.2015.0205
基金项目: 中国科学院遥感与数字地球研究所所长基金
详细信息
    通讯作者:

    陈锟山(1959-),男,中国台湾人,教授,chenks@radi.ac.cn,主要研究方向为微波遥感.

  • 中图分类号: O571.41+8

Model analysis of bistatic scattering from randomly rough surfaces

  • 摘要: 以先进积分方程模型(AIEM)为工作模型,从理论上系统分析了随机粗糙面的双站散射特征,探讨了不同粗糙程度下散射系数在方位平面上的谷点位置,并利用数值仿真模拟、实测值对理论预测的散射系数进行了说明与验证.结果显示,散射系数在方位向上的谷点位置与粗糙程度和极化特征密切相关.利用数值仿真模拟,可从物理的角度更系统深入地分析统计粗糙表面的散射特性,从而有利于设计以后的更有效的双站探测模式.

     

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出版历程
  • 收稿日期:  2015-04-09
  • 修回日期:  2015-05-05
  • 网络出版日期:  2015-10-20

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