基于多应力退化模型的智能电表可靠寿命预估

doi:10.13700/j.bh.1001-5965.2016.0582

北京航空航天大学学报 ›› 2017, Vol. 43 ›› Issue (8): 1662-1669.doi: 10.13700/j.bh.1001-5965.2016.0582

基于多应力退化模型的智能电表可靠寿命预估

张景元, 何玉珠, 崔唯佳

北京航空航天大学仪器科学与光电工程学院, 北京 100083

收稿日期:2016-07-07 修回日期:2016-12-09 出版日期:2017-08-20 发布日期:2017-02-21
通讯作者: 何玉珠 E-mail:heyuzhuhe@buaa.edu.cn
作者简介:张景元,男,硕士研究生。主要研究方向:自动测试系统软硬件设计;何玉珠,男,博士,教授,博士生导师。主要研究方向:测试系统通用性技术,故障诊断、定位技术;崔唯佳,男,博士研究生。主要研究方向:数字图像处理。

Reliability life prediction of smart meter based on multi-stress degradation model

ZHANG Jingyuan, HE Yuzhu, CUI Weijia

School of Instrumentation Science and Opto-electronics Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100083, China

Received:2016-07-07 Revised:2016-12-09 Online:2017-08-20 Published:2017-02-21

摘要/Abstract

摘要： 针对运行态智能电表难以实现可靠寿命准确预估的问题，基于广义多应力加速模型，利用加速退化的试验数据研究并确定了智能电表的寿命分布规律，首先通过分析环境应力与Weibull分布模型参数的关系，建立了新的基于对数线性回归模型的多应力退化模型；之后提出了对该新模型的参数校正的方法，实现了正常应力水平下寿命分布模型参数的求解，获得了正常应力水平下智能电表的可靠寿命及其剩余寿命的预测结果；最后设置了正常应力条件，验证了该方法的可行性，为智能电表可靠寿命的综合评估提供了一种研究方法。

关键词: 智能电表, 可靠寿命, 对数线性回归模型, 寿命分布, Weibull分布

Abstract: Aimed at the difficulty to accurately predict the reliability life of smart meter in running state, based on the generalized multi-stress accelerated model, this study researched and determined the life distribution rules of smart meter by using the accelerated degradation test data. Through the analysis of the relationship between the environment stress and the parameters of Weibull distribution model, a new multi-stress degradation model based on log-linear regression model was established, parameters correction method of the new model was proposed,the solution of the parameters of life distribution model was realized, and the prediction consequence of the reliability life and remaining life of smart meter under normal stress level was obtained. The normal stress condition is set up at the end of the paper, and the feasibility of the method is verified, so that a research method is provided for the reliability life assessment of smart meter.

Key words: smart meter, reliability life, log-linear regression model, life distribution, Weibull distribution

中图分类号:

TM933

张景元, 何玉珠, 崔唯佳. 基于多应力退化模型的智能电表可靠寿命预估[J]. 北京航空航天大学学报, 2017, 43(8): 1662-1669.

ZHANG Jingyuan, HE Yuzhu, CUI Weijia. Reliability life prediction of smart meter based on multi-stress degradation model[J]. JOURNAL OF BEIJING UNIVERSITY OF AERONAUTICS AND A, 2017, 43(8): 1662-1669.

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基于多应力退化模型的智能电表可靠寿命预估

Reliability life prediction of smart meter based on multi-stress degradation model

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