基于矩独立重要度的电路系统容错设计方法

卢震旦; 陈云霞; 金毅; 何小斌

doi:10.13700/j.bh.1001-5965.2019.0233

基于矩独立重要度的电路系统容错设计方法

doi: 10.13700/j.bh.1001-5965.2019.0233

1.
北京航空航天大学可靠性与系统工程学院, 北京 100083
2.
上海空间电源研究所, 上海 200245

详细信息

作者简介:
卢震旦  男, 博士研究生。主要研究方向:产品耐久性分析与试验技术

陈云霞  女, 博士, 教授, 博士生导师。主要研究方向:产品故障学、复杂系统可靠性建模与仿真、高可靠长寿命产品设计与试验技术等

金毅  男, 博士研究生。主要研究方向:系统故障学、产品耐久性分析与试验技术

何小斌  男, 博士。主要研究方向:新型空间电源系统控制技术

通讯作者:
陈云霞. E-mail: chenyunxia@buaa.edu.cn

中图分类号: TM133.3
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出版历程
- 收稿日期: 2019-05-18
- 录用日期: 2019-08-23
- 网络出版日期: 2020-02-20

Fault-tolerant design method for circuit system based on moment-independent importance

1.
School of Reliability and Systems Engineering, Beihang University, Beijing 100083, China
2.
Shanghai Institute of Space Power-Sources, Shanghai 200245, China

More Information

Corresponding author: CHEN Yunxia. E-mail: chenyunxia@buaa.edu.cn

摘要

摘要:
电路系统在运行过程中不可避免会发生失效，而容错设计可以有效降低失效风险。传统的电路系统容错方法主要是根据设计人员经验认知对电路系统进行分析改进，但是通常难以准确确定对系统性能影响显著的重要元器件。因此，提出了一种基于重要度分析的电路系统容错设计方法。首先，提出了电路系统矩独立重要度定义与计算方法，以对电路系统中各元器件的矩独立重要度进行计算和排序；然后，给出了冗余系数与冗余次数的定量关系，并提出重要度-冗余系数的映射准则，以此为基础即可实现电路系统的最佳容错设计；最后，以某空间电源稳压器电路为案例，验证了所提方法的有效性。所提基于矩独立重要度的电路系统容错设计方法对改进电路系统容错能力、提高电路系统可靠性有重要意义。
- 容错设计 /
- 电路分析 /
- 矩独立重要度 /
- 空间电源 /
- 稳压电源
Abstract:
Circuit failure is inevitable during operation and fault-tolerant design can significantly reduce the risk of failure. The traditional fault-tolerant method of circuit system is to analyze and improve the system mainly based on the designer's experience and cognition. However, it is usually difficult to determine accurately the important components that have significant impact on the system performance. Therefore, a fault-tolerant design method of circuit system based on importance analysis is proposed in this paper. Firstly, the definition and calculation method of moment-independent importance of circuit system are proposed to calculate and rank the moment-independent importance of components in the circuit system. Secondly, the quantitative relationship between redundancy coefficient and redundancy number is introduced, and the mapping rule of importance-redundancy coefficient is developed, based on which fault-tolerant design of circuit system can be optimized. Finally, a space power regulator is taken as an example to verify the effectiveness of the proposed method. The fault-tolerant design method of circuit system based on moment-independent importance presented in this paper is of great significance for improving the fault-tolerant ability of circuit system and improving the reliability of circuit system.
- fault-tolerant design /
- circuit analysis /
- moment-independent importance /
- space power system /
- regulator

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图 1 矩独立重要度计算过程

Figure 1. Calculation process of moment-independent importance

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图 2 稳压器电路图^[15]

Figure 2. Schematic of regulator circuit^[15]

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图 3 电路理论响应波形

Figure 3. Theoretical response waveform of circuit

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图 4 以R7为示例的容错设计等效原理图

Figure 4. Equivalent schematic of fault-tolerant design with R7 as an example

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图 5 容错设计前后波形对比

Figure 5. Comparison of waveforms before and after fault-tolerant design

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表 1 电路系统重要度计算结果

Table 1. Results of circuit system importance calculation

元器件编号	重要度
R7	0.054 324
R6	0.021 397
CX2	0.002 228
R21	0.001 047
R20	0.000 866
R4	0.000 254
R16	0.000 238
R3	0.000 218
CX1	0.000 218
LX1	0.000 215
R13	0.000 210
R1	0.000 206
C1	0.000 200
R10	0.000 187
R11	0.000 187
R9	0.000 184
R2	0.000 177
R15	0.000 172
R5	0.000 170
R19	0.000 164
R14	0.000 163
R12	0.000 160
R18	0.000 158
R8	0.000 144
C2	0.000 137
R17	0.000 137

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表 2 部分元器件冗余系数及冗余次数

Table 2. Redundancy coefficient and times of some components

元器件编号	重要度	冗余系数	冗余次数
R7	0.054 324	0.35	2.86
R6	0.021 397	0.85	2.83
CX2	0.002 228	1.35	0.74
R21	0.001 047	1.35	0.74
R20	0.000 866	1.35	0.74
R4	0.000 254	1.85	0.54
R16	0.000 238	1.85	0.54
R3	0.000 218	1.85	0.54
⋮	⋮	⋮	⋮
R17	0.000 137	1.85	0.54

下载: 导出CSV

参考文献(15)

[1]	俞保平, 俞佳.电力电子电路容错控制研究[J].现代电子技术, 2014, 37(20):154-156. doi: 10.3969/j.issn.1004-373X.2014.20.044 YU B P, YU J.Fault tolerant control of power electronic circuit based on MLD model[J].Modern Electronics Technique, 2014, 37(20):154-156(in Chinese). doi: 10.3969/j.issn.1004-373X.2014.20.044
[2]	邢琰, 吴宏鑫, 王晓磊, 等.航天器故障诊断与容错控制技术综述[J].宇航学报, 2003, 24(3):221-226. doi: 10.3321/j.issn:1000-1328.2003.03.001 XING Y, WU H X, WANG X L, et al.Survey of fault diagnosis and fault-tolerance control technology for spacecraft[J].Journal of Astronautics, 2003, 24(3):221-226(in Chinese). doi: 10.3321/j.issn:1000-1328.2003.03.001
[3]	KIM M C, SEO J, JUNG W, et al.Evaluation of effectiveness of fault-tolerant techniques in a digital instrumentation and control system with a fault injection experiment[J].Nuclear Engineering and Technology, 2018, 51(3):692-701. http://cn.bing.com/academic/profile?id=d0764e64854f16d04b225849ea5408d0&encoded=0&v=paper_preview&mkt=zh-cn
[4]	TEIFEL J.Self-voting dual-modular-redundancy circuits for single-event-transient mitigation[J].IEEE Transactions on Nuclear Science, 2008, 55(6):3435-3439. doi: 10.1109/TNS.2008.2005583
[5]	LEVITIN G, XING L, BEN-HAIM H, et al.Effect of failure propagation on cold vs.hot standby tradeoff in heterogeneous 1-out-of-N:G systems[J].IEEE Transactions on Reliability, 2015, 64(1):410-419. doi: 10.1109/TR.2014.2355514
[6]	HADDOW P C, TYRRELL A M.Challenges of evolvable hardware:Past, present and the path to a promising future[J].Genetic Programming and Evolvable Machines, 2011, 12(3):183-215. doi: 10.1007/s10710-011-9141-6
[7]	YAO X, HIGUCHI T.Promises and challenges of evolvable hardware[J].IEEE Transactions on Systems, Man and Cybernetics, Part C (Applications and Reviews), 1999, 29(1):87-97. doi: 10.1109/5326.740672
[8]	SRIVASTAVA A K.Design and simulation of virtual reconfigurable circuit for a fault tolerant system[C]//Recent Advan-ces & Innovations in Engineering.Piscataway, NJ: IEEE Press, 2014: 14631268. https://www.researchgate.net/publication/266402677_Design_and_simulation_of_virtual_reconfigurable_circuit_for_a_Fault_Tolerant_System
[9]	吴会丛, 王金泽, 周万珍.基于容错测试的高鲁棒性模拟电路演化设计研究[C]//静电放电: 从地面新技术应用到空间卫星安全防护-中国物理学会全国静电学术会议论文集.北京: 中国物理学会, 2015: 96-102. http://cpfd.cnki.com.cn/Article/CPFDTOTAL-WLJD201508001104.htm WU H C, WANG J Z, ZHOU W Z.Evolutionary design of robust analog circuit based on fault-tolerance test[C]//Electrostatic Discharge: Application of New Ground Technology to Safety Protection of Space Satellites-National Electrostatic Academic Conference of the Chinese Physical Society.Beijing: Chinese Physical Society, 2015: 96-102(in Chinese). http://cpfd.cnki.com.cn/Article/CPFDTOTAL-WLJD201508001104.htm
[10]	褚杰, 满孟华, 常小龙, 等.复杂电磁环境中高可靠性TMR-EHW电机控制电路设计[J].高电压技术, 2012, 38(9):2314-2321. http://d.old.wanfangdata.com.cn/Periodical/gdyjs201209025 CHU J, MAN M H, CHANG X L, et al.Design of motor control circuit based on TMR-EHW in complex electromagnetic environment[J].High Voltage Engineering, 2012, 38(9):2314-2321(in Chinese). http://d.old.wanfangdata.com.cn/Periodical/gdyjs201209025
[11]	张峻宾, 蔡金燕, 孟亚峰.基于EHW和RBT的电路故障自修复策略性能分析[J].北京航空航天大学学报, 2016, 42(11):2423-2435. doi: 10.13700/j.bh.1001-5965.2015.0742 ZHANG J B, CAI J Y, MENG Y F.Performance analysis of circuit fault self-repair strategy based on EHW and RBT[J].Journal of Beijing University of Aeronautics and Astronautics, 2016, 42(11):2423-2435(in Chinese). doi: 10.13700/j.bh.1001-5965.2015.0742
[12]	CUI L J, LÜ Z Z, ZHAO X P.Moment-independent importance measure of basic random variable and its probability density evolution solution[J].Science in China Series E:Technological Sciences, 2010, 53(4):1138-1145. doi: 10.1007/s11431-009-0386-8
[13]	LI L, LU Z, CHEN C.Moment-independent importance measure of correlated input variable and its state dependent parameter solution[J].Aerospace Science and Technology, 2016, 48:281-290. doi: 10.1016/j.ast.2015.11.019
[14]	FONTANA G.Revisited generalized substitution theorem and its consequences for circuit analysis[J].International Journal of Circuit Theory and Applications, 2016, 45(9):1249-1298. http://www.wanfangdata.com.cn/details/detail.do?_type=perio&id=10.1002/cta.2285
[15]	LM340, LM340A and LM7805 family wide VIN 1.5-A fixed voltage regulators[EB/OL].Texas: Texas Instruments, 2016[2019-05-17].http://www.ti.com/lit/ds/symlink/lm7800.pdf.