北京航空航天大学学报 ›› 2021, Vol. 47 ›› Issue (6): 1233-1240.doi: 10.13700/j.bh.1001-5965.2020.0140

• 论文 • 上一篇    下一篇

静态随机存储器在轨自检算法

吴洋1, 王羿2, 于新宇2, 许智龙2, 任放3, 黄缙3   

  1. 1. 中国科学技术大学, 合肥 230026;
    2. 中国科学院 安徽光学精密机械研究所, 合肥 230031;
    3. 北京空间飞行器总体设计部, 北京 100094
  • 收稿日期:2020-04-13 发布日期:2021-07-06
  • 通讯作者: 王羿 E-mail:wangyi@aiofm.ac.cn
  • 基金资助:
    王宽诚教育基金“先进偏振遥感技术与应用国际团队”(GJTD-2018-15)

Algorithm of in-orbit SRAM for self-inspection

WU Yang1, WANG Yi2, YU Xinyu2, XU Zhilong2, REN Fang3, HUANG Jin3   

  1. 1. University of Science and Technology of China, Hefei 230026, China;
    2. Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, China;
    3. Beijing Institute of Spacecraft System Engineering, Beijing 100094, China
  • Received:2020-04-13 Published:2021-07-06
  • Supported by:
    K.C.Wong Education "International Team of Advanced Polarization Remote Sensing Technology and Applications" (GJTD-2018-15)

摘要: 静态随机存储器(SRAM)在轨自检应用于星载电子设备上电初始化过程中,能够在电子设备开始工作前发现存储器的故障单元,为评估电子设备健康状态提供依据。分析了SRAM的结构和常见的故障原理,针对在轨应用这一特殊背景开展研究,提出了对典型测试算法的改进方案。在完成对改进方案的分析和评价后,以8 K×8 bit存储器为例开展算法的实现,并验证了改进方案的可行性。与典型测试算法相比,所提改进方案具有资源开销少、故障覆盖率高等优点。

关键词: 静态随机存储器(SRAM), 在轨自检, March算法, 集成电路测试, 航天产品

Abstract: In-orbit self-inspection of Static Random Access Memory (SRAM) in spaceborne electronic equipment is used in the power-on initialization process. It is able to find the faulty unit of the memory before equipment starts to work. It provides a basis for evaluating the health status of electronic equipment. The structure and main failure principle of SRAM were analyzed, and the research in the special background of in-orbit application was conducted. Then, an improved test algorithm for the typical one was proposed. After the analysis and evaluation of the improved algorithm, the implementation of the algorithm on a 8 K×8 bit SRAM was carried out. Experimental results show that the improved algorithm is feasible. Compared with typical test algorithm, the improved algorithm has the advantages of low resource consumption and high fault coverage.

Key words: Static Random Access Memory (SRAM), in-orbit self-inspection, March algorithm, integrated circuit test, aerospace product

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