留言板

尊敬的读者、作者、审稿人, 关于本刊的投稿、审稿、编辑和出版的任何问题, 您可以本页添加留言。我们将尽快给您答复。谢谢您的支持!

姓名
邮箱
手机号码
标题
留言内容
验证码

采用区间分析的加速退化试验评估方法

刘乐 李晓阳 姜同敏

刘乐, 李晓阳, 姜同敏等 . 采用区间分析的加速退化试验评估方法[J]. 北京航空航天大学学报, 2015, 41(12): 2225-2231. doi: 10.13700/j.bh.1001-5965.2014.0790
引用本文: 刘乐, 李晓阳, 姜同敏等 . 采用区间分析的加速退化试验评估方法[J]. 北京航空航天大学学报, 2015, 41(12): 2225-2231. doi: 10.13700/j.bh.1001-5965.2014.0790
LIU Le, LI Xiaoyang, JIANG Tongminet al. Evaluation method for accelerated degradation testing with interval analysis[J]. Journal of Beijing University of Aeronautics and Astronautics, 2015, 41(12): 2225-2231. doi: 10.13700/j.bh.1001-5965.2014.0790(in Chinese)
Citation: LIU Le, LI Xiaoyang, JIANG Tongminet al. Evaluation method for accelerated degradation testing with interval analysis[J]. Journal of Beijing University of Aeronautics and Astronautics, 2015, 41(12): 2225-2231. doi: 10.13700/j.bh.1001-5965.2014.0790(in Chinese)

采用区间分析的加速退化试验评估方法

doi: 10.13700/j.bh.1001-5965.2014.0790
基金项目: 国家自然科学基金(61104182);中央高校基本科研业务费专项资金(YWF-14-KKX-004)
详细信息
    作者简介:

    刘乐(1989-),男,安徽蚌埠人,博士研究生,liule89@gmail.com

    通讯作者:

    李晓阳(1980-),女,贵州贵阳人,副教授,leexy@buaa.edu.cn,主要研究方向为加速试验技术、可靠性理论.

  • 中图分类号: TB114.3

Evaluation method for accelerated degradation testing with interval analysis

  • 摘要: 传统的加速退化试验(ADT)评估方法基于精确退化数据进行可靠性和寿命评估,然而考虑到测量中人的不确定因素,试验数据可能是区间型而非精确数据.针对此类问题,基于维纳过程提出一种采用区间分析的加速退化试验寿命评估方法,区间分析方法包括可能性模型和必要性模型.首先基于区间回归将各加速应力条件下的区间退化数据的建模分析问题转化为二次规划问题,利用可能性模型获取各应力条件下的漂移系数区间和扩散系数.然后利用必要性模型结合加速模型,外推得到正常工作应力条件下的漂移系数区间,进而分析测量不确定性与可靠性和寿命评估结果的关系.最后通过数值案例对提出的方法进行阐述和验证,并进行不确定性敏感性分析.结果表明,可靠性和寿命评估结果受测量中认知不确定性的影响,降低该不确定性水平能够保证评估结果的合理性.

     

  • [1] Nelson W B.Accelerated testing:Statistical models,test plans,and data analysis[M].New York:John Wiley & Sons,2009:493-544.
    [2] Meeker W Q,Escobar L A,Lu C J.Accelerated degradation tests:Modeling and analysis[J].Technometrics,1998,40(2):89-99.
    [3] 邓爱民,陈循,张春华,等.加速退化试验技术综述[J].兵工学报,2007,28(8):1002-1007. Deng A M,Chen X,Zhang C H,et al.A comprehensive review of accelerated degradation testing[J].Acta Armamentarii,2007,28(8):1002-1007(in Chinese).
    [4] Wang Z,Huang H Z,Du L.Reliability analysis on competitive failure processes under fuzzy degradation data[J].Applied Soft Computing,2011,11(3):2964-2973.
    [5] Gonzalez-Gonzalez D S,Alejo R J P,Cantu-Sifuentes M,et al.A non-linear fuzzy regression for estimating reliability in a degradation process[J].Applied Soft Computing,2014,16:137-147.
    [6] Alefeld G,Mayer G.Interval analysis:Theory and applications[J].Journal of Computational and Applied Mathematics,2000,121(1-2):421-464.
    [7] Tanaka H,Lee H.Interval regression analysis by quadratic programming approach[J].IEEE Transactions on Fuzzy Systems,1998,6(4):473-481.
    [8] 王军,邱志平,王晓军.应力强度因子的区间分析方法[J].航空学报,2008,29(3):611-615. Wang J,Qiu Z P,Wang X J.Interval analysis for stress intensity factors[J].Acta Aeronautica et Astronautica Sinica,2008,29(3):611-615(in Chinese).
    [9] Yu I T,Chang C L.Applying Bayesian model averaging for quantile estimation in accelerated life tests[J].IEEE Transactions on Reliability,2012,61(1):74-83.
    [10] Chateauneuf A.Accelerated life testing and degradation modeling[J].Reliability Engineering & System Safety,2014,131:228.
    [11] Ye Z S,Xie M.Stochastic modelling and analysis of degradation for highly reliable products[J].Applied Stochastic Models in Business and Industry,2014,31(1):13-32.
    [12] Park C,Padgett W J.Stochastic degradation models with several accelerating variables[J].IEEE Transactions on Reliability,2006,55(2):379-390.
    [13] Pan Z Q,Balakrishnan N.Multiple-steps step-stress accelerated degradation modeling based on Wiener and Gamma processes[J].Communications in Statistics-Simulation and Computation,2010,39(7):1384-1402.
    [14] Li X Y,Jiang T M,Sun F Q,et al.Constant stress ADT for superluminescent diode and parameter sensitivity analysis[J].Eksploatacja I Niezawodnosc-Maintenance and Reliability,2010(2):21-26.
    [15] Wang X,Jiang P,Guo B,et al.Real-time reliability evaluation with a general Wiener process-based degradation model[J].Quality and Reliability Engineering International,2014,30(2):205-220.
    [16] Escobar L A,Meeker W Q.A review of accelerated test models[J].Statistical Science,2006,21(4):552-577.
    [17] Chhikara R S,Folks J L.The inverse Gaussian distribution:Theory,methodology,and applications[M].New York:CRC Press,1988:23-29.
    [18] Meeker W Q,Escobar L A.Statistical methods for reliability data[M].New York:John Wiley & Sons,1998:631.
  • 加载中
计量
  • 文章访问数:  913
  • HTML全文浏览量:  54
  • PDF下载量:  554
  • 被引次数: 0
出版历程
  • 收稿日期:  2014-12-15
  • 修回日期:  2015-02-12
  • 网络出版日期:  2015-12-20

目录

    /

    返回文章
    返回
    常见问答