北京航空航天大学学报 ›› 2006, Vol. 32 ›› Issue (02): 181-185.

• 论文 • 上一篇    下一篇

通用ATE开关资源测试路径模型及应用

赵瑞贤, 孟晓风, 王国华   

  1. 北京航空航天大学 仪器科学与光电工程学院, 北京 100083
  • 收稿日期:2004-12-03 出版日期:2006-02-28 发布日期:2010-09-20
  • 作者简介:赵瑞贤(1974-),男,河北清河人,博士生, zzhaoruixian@sohu.com.

General-utility testing path model of switches for ATE and application

Zhao Ruixian, Meng Xiaofeng, Wang Guohua   

  1. School of Instrument Science and Opto-electronics Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100083, China
  • Received:2004-12-03 Online:2006-02-28 Published:2010-09-20

摘要: 针对自动测试设备(ATE)测试程序开发中的开关资源测试路径搜索复杂、冲突判断困难、管理难度大等问题,提出了通用ATE开关资源测试路径模型,给出了模型的构造方法和多开关资源级联的级联算法,介绍了模型的具体应用.模型实现了ATE测试过程中开关资源测试路径冲突判断、最佳测试路径自动搜索、测试路径故障隔离、测试程序与具体测试路径硬件资源无关.提高了测试程序(TP)的通用性和可移植性,降低了TP开发的工作量.

Abstract: In order to solve the questions such as searching testing path, judging testing path conflict and managing testing path of switches during the course of programming testing programs (TP) of automation testing equipment (ATE), a general-utility testing path model of switches was brought forward, the model general description and interlink algorithm for much more switches connecting were presented, and the material application methods of the model was introduced. The automated searching of optimum testing path and judging of testing path conflict are realized, the fault of testing path can be isolated well and TP are not related to the material path hardware by the model means. Accordingly the general-utility and replantability of TP are improved, and the workload of programming TP is reduced.

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