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�������պ����ѧѧ�� 2006, Vol. 32 Issue (02) :181-185    DOI:
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�������պ����ѧ ������ѧ���繤��ѧԺ, ���� 100083
General-utility testing path model of switches for ATE and application
Zhao Ruixian, Meng Xiaofeng, Wang Guohua*
School of Instrument Science and Opto-electronics Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100083, China

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ժҪ ����Զ������豸(ATE)���Գ��򿪷��еĿ�����Դ����·���������ӡ���ͻ�ж����ѡ������Ѷȴ������,�����ͨ��ATE������Դ����·��ģ��,������ģ�͵Ĺ��췽���Ͷ࿪����Դ�����ļ����㷨,������ģ�͵ľ���Ӧ��.ģ��ʵ����ATE���Թ����п�����Դ����·����ͻ�жϡ���Ѳ���·���Զ�����������·�����ϸ��롢���Գ�����������·��Ӳ����Դ�޹�.����˲��Գ���(TP)��ͨ���ԺͿ���ֲ��,������TP�����Ĺ�����.
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Abstract�� In order to solve the questions such as searching testing path, judging testing path conflict and managing testing path of switches during the course of programming testing programs (TP) of automation testing equipment (ATE), a general-utility testing path model of switches was brought forward, the model general description and interlink algorithm for much more switches connecting were presented, and the material application methods of the model was introduced. The automated searching of optimum testing path and judging of testing path conflict are realized, the fault of testing path can be isolated well and TP are not related to the material path hardware by the model means. Accordingly the general-utility and replantability of TP are improved, and the workload of programming TP is reduced.
Keywords�� automation testing equipment   testing path   switches   optimization   path conflict     
Received 2004-12-03;
About author: ������(1974-),��,�ӱ������,��ʿ��, zzhaoruixian@sohu.com.
������, ������, ������.ͨ��ATE������Դ����·��ģ�ͼ�Ӧ��[J]  �������պ����ѧѧ��, 2006,V32(02): 181-185
Zhao Ruixian, Meng Xiaofeng, Wang Guohua.General-utility testing path model of switches for ATE and application[J]  JOURNAL OF BEIJING UNIVERSITY OF AERONAUTICS AND A, 2006,V32(02): 181-185
http://bhxb.buaa.edu.cn//CN/     ��     http://bhxb.buaa.edu.cn//CN/Y2006/V32/I02/181
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