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�������պ����ѧѧ�� 2005, Vol. 31 Issue (08) :874-878    DOI:
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ʯ����, ����, ����*
�������պ����ѧ ����ϵͳ����ϵ, ���� 100083
Study on sufficiency of sample set in testability demonstration based on information model
Shi Junyou, Kang Rui, Tian Zhong*
Dept. of System Engineering of Engineering Technology, Beijing University of Aeronautics and Astronautics, Beijing 100083, China

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Abstract�� The failure mode information model of the product was created. This information model contained the failure mode data, the structural unit data, the function data, the test data and the mapping relation about them. According to this information model, three types’ failure mode equivalence sets were defined. They were the failure mode unit-equivalence set, the failure mode function-equivalence set and the failure mode test-equivalence set. Based on these failure mode equivalence sets, three types of classical sufficiency measurements and criterions for the sample set in the testability demonstration were defined. They were the unit-coverage sufficiency measurement and criterion, the function-coverage sufficiency measurement and criterion and the test-coverage sufficiency measurement and criterion. The application’s scopes of them were analyzed, and the integrated sufficiency measurements and criterions were established. The integrated sufficiency measurement could be used to evaluate the sufficient degree of the sample set. The integrated sufficiency criterion could be used to determine the required structure of sample set. The application’s method and flow for the integrated adequacy measurement and criterion were established. A case indicates that the method is feasible.
Keywords�� failure mode   sample set   information model   test   sufficiency     
Received 2004-03-25;
About author: ʯ����(1973-),��,���������������,��ʦ, shijy016@sina.com.
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ʯ����, ����, ����.������Ϣģ�͵IJ���������������������о�[J]  �������պ����ѧѧ��, 2005,V31(08): 874-878
Shi Junyou, Kang Rui, Tian Zhong.Study on sufficiency of sample set in testability demonstration based on information model[J]  JOURNAL OF BEIJING UNIVERSITY OF AERONAUTICS AND A, 2005,V31(08): 874-878
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