北京航空航天大学学报 ›› 2005, Vol. 31 ›› Issue (06): 686-689.

• 论文 • 上一篇    下一篇

微波泄漏对光抽运铯束频标准确度影响的分析

潘顺康1, 吕善伟1, 冯克明2, 王伟2   

  1. 1. 北京航空航天大学 电子信息工程学院, 北京 100083;
    2. 北京无线电计量测试研究所, 北京 100854
  • 收稿日期:2004-02-16 发布日期:2010-09-21
  • 作者简介:潘顺康(1973-),男,广西桂林人,博士生, ppkk21882@sina.com.

Analysis of the effects of microwave leakages on the accuracy of optically pumped cesium frequency standards

Pan Shunkang1, Feng Keming1, Wang Wei2   

  1. 1. School of Electronics and Information Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100083, China;
    2. Beijing Institute of Radio Metrology & Measurement, Beijing 100854
  • Received:2004-02-16 Published:2010-09-21

摘要: 微波泄漏是影响光抽运铯原子钟准确度的主要因素之一. 傅里叶变换分析法是分析其影响的主要手段,但该方法只能用来分析有效原子速度分布很窄的情况.通过分析和计算,推导出频移随漏场的位置、相位和幅度变化的关系式.计算和分析的结果表明,漏场引起频移大小和漂移区的长度、输入微波功率值和漏场的相位、强度和位置等有关.所得的结果和用傅里叶变换方法分析所得的结果是一致的,分析的方法不受原子有效速度限制.

Abstract: One of the major factors which effect the accuracy of optically pumped cesium frequency standards is caused by microwave leakages. Fourier transform is the major method to analyze the frequency offsets of small optically pumped cesium frequency standards, which is limited to analyze the case of atomic velocity being in narrow distribution. Formula of the frequency shift as a function of microwave leakages are derived by analysis and calculation. The results of calculation and analysis indicate that the magnitude of frequency offset caused by leaking microwave fields is in dependence on the length of the free field region,microwave power and the phase,amplitude and the position of the leaking microwave fields. The derived results are consistent with the conclusion which was educed by using the method of Fourier transform. However, the method is not limited by the velocity distribution of atom.

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