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�������պ����ѧѧ�� 2004, Vol. 30 Issue (07) :662-665    DOI:
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Parametric faults detecting with multi-frequency test applied in ATE
Zhang Wei, Shen Shituan, Li Yihua*
School of Electronics and Information Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100083, China

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Abstract�� Assisted with the sensitivity of the linear analog circuits, the feasibility of parametric faults detection was analyzed through the maximum fault errors acquired at the sensitive frequencies, a stimulation matrix and its stimulation expression were put forward on the test points information. A united stimulation acquisition algorithm was designed for detecting the faulty circuits under automatic test equipment in order to decrease the test cost. The fault detection effect illustrated in the simulation result shows that this method can magnify the fault errors, and help discriminate the faulty signals according to their sensitive frequency responses under different test points.
Keywords�� sensitivity   fault detection   sensitive frequency   united stimulation     
Received 2003-02-20;
About author: �� ��(1974-),��,ɽ����ͬ��,��ʿ��, wilsonzh@sina.com.
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����, ��ʿ��, ���仪.ATE�����µĶ�Ƶ���Բ������ϼ��[J]  �������պ����ѧѧ��, 2004,V30(07): 662-665
Zhang Wei, Shen Shituan, Li Yihua.Parametric faults detecting with multi-frequency test applied in ATE[J]  JOURNAL OF BEIJING UNIVERSITY OF AERONAUTICS AND A, 2004,V30(07): 662-665
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