北京航空航天大学学报 ›› 2004, Vol. 30 ›› Issue (07): 662-665.

• 论文 • 上一篇    下一篇

ATE环境下的多频测试参数故障检测

张玮, 沈士团, 李驿华   

  1. 北京航空航天大学 电子信息工程学院, 北京 100083
  • 收稿日期:2003-02-20 出版日期:2004-07-31 发布日期:2010-09-21
  • 作者简介:张 玮(1974-),男,山西大同人,博士生, wilsonzh@sina.com.

Parametric faults detecting with multi-frequency test applied in ATE

Zhang Wei, Shen Shituan, Li Yihua   

  1. School of Electronics and Information Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100083, China
  • Received:2003-02-20 Online:2004-07-31 Published:2010-09-21

摘要: 从线性模拟电路灵敏度的概念入手,分析了通过获取敏感频点激励下的最大故障误差来检测电路参数故障的可能性,提出了一种针对测试频率和测点信息的激励矩阵.设计了适合自动测试系统进行模拟电路参数故障检测的联合激励方式提取算法以降低测试成本.仿真结果所给出的故障检测效果显示,该方法可以放大故障误差,并有助于利用敏感频点响应的差别来辨别故障信号.

Abstract: Assisted with the sensitivity of the linear analog circuits, the feasibility of parametric faults detection was analyzed through the maximum fault errors acquired at the sensitive frequencies, a stimulation matrix and its stimulation expression were put forward on the test points information. A united stimulation acquisition algorithm was designed for detecting the faulty circuits under automatic test equipment in order to decrease the test cost. The fault detection effect illustrated in the simulation result shows that this method can magnify the fault errors, and help discriminate the faulty signals according to their sensitive frequency responses under different test points.

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