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Non-interference test method of embedded system software
Zhang Jiong, Jin Huihua, Shang Lihong, Chang Sheng*
School of Computer Science and Technology, Beijing University of Aeronautics and Astronautics, Beijing 100083, China

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Abstract�� Traditional test methods of embedded system software impose on the object system and the result of the test are not accurate enough as expected. Non-interference test (NIT) method can solve the problem. Not same with the traditional test methods, NIT is completely non-interference to the object software. By analyzing the basic characteristics of NIT, an application model of NIT was set up. There must be three modules in this model, include static analyse module, dynamic analyse module and data gathering subsystem which tracks the object system by hardware. Static analyse module figures out the static characteristics of the object software and tells the other two modulus how to gather the state data of the object system and how to understand the data. In all steps of the test cycle, NIT does not add any instructions executed only within the test round into the object program.
Keywords�� software   data acquisition   embedded system   software test   white box test     
Received 2003-02-21;
Fund:

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About author: �� ��(1976-),��,����������,��ʿ��, zhangjiong@tom.com.
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�ž�, ��ݻ�, ������, ��ʢ.һ��Ƕ��ʽϵͳ����ķǸ�����Է���[J]  �������պ����ѧѧ��, 2004,V30(07): 666-669
Zhang Jiong, Jin Huihua, Shang Lihong, Chang Sheng.Non-interference test method of embedded system software[J]  JOURNAL OF BEIJING UNIVERSITY OF AERONAUTICS AND A, 2004,V30(07): 666-669
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