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�������պ����ѧѧ�� 2002, Vol. 28 Issue (2) :190-193    DOI:
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Characterization of 3-D Surface Topography by Root-Mean-Square Wavelengt
LI Cheng-gui, LI Xing-shan*
Beijing University of Aeronautics and Astronautics, School of Automation Science and Electrical Engineering

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Abstract�� Based on fractal geometry theory, a root-mean-square(RMS) wavelength method was proposed to quantitatively evaluate a 3D stochastic surface topography, by means of the surface spectral moments. Through DFT of the profile measured by a Talysurf-10 contact stylus instrument, we obtained the power spectrum and thefractal dimension of the profile. Further, the zero and 2nd order spectral moments of the profile and the surface were obtained. Using these parameters, the evaluation of RMS wavelength was conducted. By experiments for ground samples, the validity of the present method was confirmed.
Keywords�� surface roughness   evaluations   measurements   fractal dimension     
Received 2000-06-20;
About author: ��ɹ�(1964-),��,�ӱ�������,������,100083,����.
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��ɹ�, ������.��ά����ֲڶȵľ�������������[J]  �������պ����ѧѧ��, 2002,V28(2): 190-193
LI Cheng-gui, LI Xing-shan.Characterization of 3-D Surface Topography by Root-Mean-Square Wavelengt[J]  JOURNAL OF BEIJING UNIVERSITY OF AERONAUTICS AND A, 2002,V28(2): 190-193
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http://bhxb.buaa.edu.cn//CN/     ��     http://bhxb.buaa.edu.cn//CN/Y2002/V28/I2/190
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