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太赫兹肖特基二极管混频性能分析

樊国丽 江月松

樊国丽, 江月松. 太赫兹肖特基二极管混频性能分析[J]. 北京航空航天大学学报, 2010, 36(12): 1440-1443.
引用本文: 樊国丽, 江月松. 太赫兹肖特基二极管混频性能分析[J]. 北京航空航天大学学报, 2010, 36(12): 1440-1443.
Fan Guoli, Jiang Yuesong. Schottky diodes mixing performance evaluation in terahertz band[J]. Journal of Beijing University of Aeronautics and Astronautics, 2010, 36(12): 1440-1443. (in Chinese)
Citation: Fan Guoli, Jiang Yuesong. Schottky diodes mixing performance evaluation in terahertz band[J]. Journal of Beijing University of Aeronautics and Astronautics, 2010, 36(12): 1440-1443. (in Chinese)

太赫兹肖特基二极管混频性能分析

基金项目: 总装武器装备探索研究项目(#7130730)
详细信息
    作者简介:

    樊国丽(1979-),女,山西夏县人,博士生,glfan@ee.buaa.edu.cn.

  • 中图分类号: TN 36

Schottky diodes mixing performance evaluation in terahertz band

  • 摘要: 工作在太赫兹波段的肖特基混频二极管的混频性能会受到高频效应的影响而降低.将有限差分算法引入二极管内部电磁场的计算中,并从结电容并联效应、趋肤效应、等离子共振、速率饱和效应四个方面分析了高频效应对二极管混频性能的影响,并以截止频率作为品质因数,对二极管结构参数进行优化设计.仿真实验结果表明:随着频率的提高,减小阳极直径、减小外延层厚度和提高外延层掺杂浓度能减小高频效应的影响,提高太赫兹二极管的混频性能.

     

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出版历程
  • 收稿日期:  2009-11-06
  • 网络出版日期:  2010-12-30

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