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考虑寄生参数的集成电路ESD损伤仿真方法

吕卫民 胡冬 马静华 谢劲松

吕卫民, 胡冬, 马静华, 等 . 考虑寄生参数的集成电路ESD损伤仿真方法[J]. 北京航空航天大学学报, 2011, 37(9): 1100-1104.
引用本文: 吕卫民, 胡冬, 马静华, 等 . 考虑寄生参数的集成电路ESD损伤仿真方法[J]. 北京航空航天大学学报, 2011, 37(9): 1100-1104.
Lü Weimin, Hu Dong, Ma Jinghua, et al. ESD damage simulation of integrated circuits by the consideration on parasitic parameters[J]. Journal of Beijing University of Aeronautics and Astronautics, 2011, 37(9): 1100-1104. (in Chinese)
Citation: Lü Weimin, Hu Dong, Ma Jinghua, et al. ESD damage simulation of integrated circuits by the consideration on parasitic parameters[J]. Journal of Beijing University of Aeronautics and Astronautics, 2011, 37(9): 1100-1104. (in Chinese)

考虑寄生参数的集成电路ESD损伤仿真方法

基金项目: 总装预研基金资助项目(9140A27020210JB1404)
详细信息
    作者简介:

    吕卫民(1970-),男,山东烟台人,博士生,lwm_yt@sina.com.

  • 中图分类号: TN 406

ESD damage simulation of integrated circuits by the consideration on parasitic parameters

  • 摘要: 在传统的基于设计电路的ESD (Electro-Static Discharge)损伤仿真中,通常不考虑版图物理结构的影响,其仿真结果往往与实际损伤情况出现较大偏差,因此提出了一种考虑版图设计中寄生参数的集成电路ESD损伤的仿真方法.首先给出了仿真应用的具体分析流程.然后按照经验公式提取法明确了各种寄生参数的计算模型.最后,以集成运算放大器LM741为例,对其进行了ESD损伤模拟,再通过击打实验、失效定位与电性能测试,结果表明:仿真与实验结果具有较好的一致性,验证了该方法的有效性.

     

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出版历程
  • 收稿日期:  2010-09-27
  • 网络出版日期:  2011-09-30

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