基于伪寿命的加速退化机理一致性边界检验

林逢春; 王前程; 陈云霞; 康锐

基于伪寿命的加速退化机理一致性边界检验

北京航空航天大学可靠性与系统工程学院, 北京 100191

详细信息

中图分类号: O 213.2; O 212
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- 被引次数: 0
出版历程
- 收稿日期: 2010-10-25
- 网络出版日期: 2012-02-29

Pseudo-life-based test method of mechanism consistency boundary for accelerated degradation testing

School of Reliability and Systems Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100191, China

摘要

摘要: 根据寿命型随机变量的加速机理一致性条件,提出一种基于伪寿命的加速退化机理一致性边界检验方法,通过由低到高逐一对各个加速应力水平下的退化机理一致性进行检验,来确定加速退化机理一致性的边界应力水平.针对工程常用的两类寿命型分布——对数正态分布和Weibull分布,分别以对数标准差和形状参数为退化机理表征量,在产品伪寿命估计的基础上建立了退化机理表征量齐性检验的F统计量,导出了退化机理一致性检验拒绝域的解析式,给出了退化机理一致性边界检验的具体步骤.该方法能够充分利用多个应力水平下表征产品退化机理一致的横向信息,有效提高了检验的精度.以某镀膜平板玻璃热退化机理一致性边界温度的确定为例,分析说明了该方法的合理性与有效性.
- 机理一致性 /
- 加速退化试验 /
- 伪寿命 /
- F 检验
Abstract: A pseudo-life-based test method of mechanism consistency boundary for accelerated degradation testing was proposed, according to mechanism consistency condition for lifetime random variables. Based on the pseudo life estimates, an F statistic was established to test the homogeneity of degradation mechanism characteristic parameters, where the characteristic parameter is logarithm standard deviation for log-normal distribution and shape parameter for Weibull distribution. And the exact rejection region was given. Using the F statistic, mechanism consistency test was done level by level from lower to higher, until the consistency condition was unsatisfied or the pseudo life estimates at all levels had been analyzed. Then, the stress level of mechanism consistency boundary was determined. This method can make good use of the transverse information from the degradation mechanism consistency between different accelerated stress levels, and effectively increase test precision. It has been used to determine the thermal degradation mechanism consistency boundary temperature for a coating flat glass, and the results show the rationality and validity of the presented method.
- mechanism consistency /
- accelerated degradation testing /
- pseudo life /
- F test

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参考文献(14)

[1]	Wu S J,Shao J.Reliability analysis using the least squares method in nonlinear mixed-effect degradation models[J].Statistica Sinica,1999,9(3):855-877
[2]	Liao H T,Elsayed E A.Reliability prediction and testing plan based on an accelerated degradation rate model[J].International Journal of Materials and Product Technology,2004,21(5):402-422
[3]	Liao H,Elsayed E A.Reliability inference for field conditions from accelerated degradation testing[J].Naval Research Logistics,2006,53(6):576-587
[4]	Park J I,Bae S J.Direct prediction methods on lifetime distribution of organic light-emitting diodes from accelerated degradation tests[J].IEEE Transactions on Reliablity,2010,59(1):74-90
[5]	赵建印,刘芳.加速退化失效产品可靠性评估方法[J].哈尔滨工业大学学报,2008,40(10):1669-1671 Zhao Jianyin,Liu Fang.Reliability assessment from accelerated performance degradation tests[J].Journal of Harbin Institute of Technology,2008,40(10):1669-1671(in Chinese)
[6]	Hu J M,Baker D B,Dasgupta A,et al.Role of failure-mechanism identification in accelerated testing[J].Journal of the IES,1993,26(4):39-45
[7]	McLean H W.HALT,HASS,and HASA explained:accelerated reliability techniques [M].Revised Edition.Milwaukee:American Society for Quality,Quality Press,2009
[8]	茆诗松,王玲玲.加速寿命试验[M].北京:科学出版社,2000:85,139 Mao Shisong,Wang Lingling.Accelerated life testing[M].Beijing:Science Press,2000:85,139(in Chinese)
[9]	赵宇,杨军,马小兵.可靠性数据分析教程[M].北京:北京航空航天大学出版社,2009:184-188 Zhao Yu,Yang Jun,Ma Xiaobing.Reliability data analysis tutorial[M].Beijing:Beijing University of Aeronautics and Astronautics Press,2009:184-188 (in Chinese)
[10]	周源泉,翁朝曦,叶喜涛.论加速系数与失效机理不变的条件(I)——寿命型随机变量的情况[J].系统工程与电子技术,1996,18(1):55-67 Zhou Yuanquan,Weng Zhaoxi,Ye Xitao.Study on accelerated factor and condition for constant failure mechanism (I)—the case for lifetime is a random variable[J].Journal of Systems Engineering and Electronics,1996,18(1):55-67(in Chinese)
[11]	孙祝岭.失效机理不变的假设检验[J].电子产品可靠性与环境试验,2009,27(2):1-5 Sun Zhuling.Hypothesis testing for constant failure mechanism[J].Electronic Product Reliability and Environmental Testing,2009,27(2):1-5(in Chinese)
[12]	戴树森,费鹤良,王玲玲,等.可靠性试验及其统计分析:上册[M].北京:国防工业出版社,1983:536-539 Dai Shusen,Fei Heliang,Wang Lingling,et al.Reliability testing and its statistical analysis:vol.1[M].Beijing:National Defense Industry Press,1983:536-539(in Chinese)
[13]	中国电子技术标准化研究所.可靠性试验用表[M].北京:国防工业出版社,1987 The Chinese Research Institute for Electron Technology.Handbook of table for reliability testing[M].Beijing:National Defense Industry Press,1987(in Chinese)
[14]	周源泉,翁朝曦.可靠性评定[M].北京:科学出版社,1990:12-13 Zhou Yuanquan,Weng Zhaoxi.Reliability assessment[M].Beijing:Science Press,1990:12-13(in Chinese)