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基于物理光学假设的导体表面电流密度误差分析

姬金祖 马云鹏 黄沛霖 张中建

姬金祖, 马云鹏, 黄沛霖, 等 . 基于物理光学假设的导体表面电流密度误差分析[J]. 北京航空航天大学学报, 2013, 39(5): 660-664.
引用本文: 姬金祖, 马云鹏, 黄沛霖, 等 . 基于物理光学假设的导体表面电流密度误差分析[J]. 北京航空航天大学学报, 2013, 39(5): 660-664.
Ji Jinzu, Ma Yunpeng, Huang Peilin, et al. Error analysis of surface current density on perfect electric conductor based on physical optics[J]. Journal of Beijing University of Aeronautics and Astronautics, 2013, 39(5): 660-664. (in Chinese)
Citation: Ji Jinzu, Ma Yunpeng, Huang Peilin, et al. Error analysis of surface current density on perfect electric conductor based on physical optics[J]. Journal of Beijing University of Aeronautics and Astronautics, 2013, 39(5): 660-664. (in Chinese)

基于物理光学假设的导体表面电流密度误差分析

基金项目: 总装备部武器装备预先研究项目
详细信息
  • 中图分类号: V218

Error analysis of surface current density on perfect electric conductor based on physical optics

  • 摘要: 用物理光学法计算理想导体雷达散射截面过程中,需要基于无限大切平面假设计算表面电流密度.只有对表面比较光滑的电大尺寸目标,该假设才近似满足,而在一般情况下由该方法求得的表面电流密度存在误差.将二维导体圆柱、方柱以及三角柱等构型在不同入射频率、极化下的物理光学表面电流密度与精确解或矩量法结果进行了对比.分析表明:横磁波照射时物理光学法除在顶点处有较大误差外,基本能够正确反映出表面电流密度分布情况.横电波情形下物理光学法难以如实反映照射面和阴影面电流的谐振变化,与入射方向平行的面上表面电流密度也有较大误差.

     

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出版历程
  • 收稿日期:  2012-05-27
  • 修回日期:  2012-11-26
  • 网络出版日期:  2013-05-31

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