北京航空航天大学学报 ›› 2015, Vol. 41 ›› Issue (1): 33-37.doi: 10.13700/j.bh.1001-5965.2014.0079

• 论文 • 上一篇    下一篇

任意波形失真度的一种评价方法

孙璟宇1,2, 王中宇1, 梁志国2   

  1. 1. 北京航空航天大学 仪器科学与光电工程学院, 北京 100191;
    2. 北京长城计量测试技术研究所, 北京 100095
  • 收稿日期:2014-02-27 出版日期:2015-01-20 发布日期:2015-02-04
  • 通讯作者: 王中宇(1963-),男,河南洛阳人,教授,mewan@buaa.edu.cn,主要研究方向为光电技术及其应用、动态测量基础理论与技术. E-mail:mewan@buaa.edu.cn
  • 作者简介:孙璟宇(1973-),男,陕西白水人,博士生,saint@cimm.com.cn
  • 基金资助:

    国防军工计量“十五”计划重点科研项目(J052001B001)

Evaluation method for distortion of arbitrary waveform

SUN Jingyu1,2, WANG Zhongyu1, LIANG Zhiguo2   

  1. 1. School of Instrumentation Science and Opto-electronics Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100191, China;
    2. Beijing Changcheng Institute of Metrology and Measurement, Beijing 100095, China
  • Received:2014-02-27 Online:2015-01-20 Published:2015-02-04

摘要:

鉴于失真度指标在评价波形总体质量方面具有的独特优势并获得广泛认可,在对任意波形失真度定义分析的基础上,提出一种使用波形非线性拟合方式进行任意波形失真度的评价方法.对于待评价的任意波形,首先通过模型平移,从时间维度上与被评价任意波形进行“相似拟合”,然后通过最小二乘拟合,在幅度上与被评价任意波形进行拟合,从而得到被评价任意波形的最佳拟合曲线,进而计算得到任意波形的失真度.实验结果显示,该方法具有较强的可行性与适应性,能够解决对于任意波形失真度的评价问题,并进而解决对任意波形以及任意波发生器的计量校准问题.

关键词: 任意波形, 失真度, 评价, 校准, 计量

Abstract:

The index of distortion to evaluate the total quality of waveforms has special advantages and has been accepted widely by most people. Based on the analyses of the distortion definition of arbitrary waveform, a method using nonlinear-curve-fitting to evaluate the distortion of arbitrary waveform was discussed. Firstly, by moving the model in time domain, the“similar-fitting” model to the arbitrary waveform to be evaluated can be obtained. Then, using the least-square fitting method, the fitting curve on amplitude domain can be gotten, and this is just the best fitting curve to the arbitrary waveform to be evaluated. Thus, the distortion of the arbitrary waveform can be calculated. The results of the experiment show that this method has obviously practicability and flexibility, and can resolve the problem of evaluation for the distortion of arbitrary waveform. And then, it can resolve the problem of calibration for arbitrary waveform and arbitrary waveform generator (AWG).

Key words: arbitrary waveform, distortion, evaluation, calibration, metrology

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