北京航空航天大学学报 ›› 2015, Vol. 41 ›› Issue (10): 1765-1776.doi: 10.13700/j.bh.1001-5965.2015.0205

• 电磁理论与应用 • 上一篇    下一篇

随机粗糙面的双站散射模型分析

陈锟山1,2, 李召良2, 刘玉1   

  1. 1. 中国科学院遥感与数字地球研究所遥感科学国家重点实验室, 北京 100101;
    2. 中国农业科学院农业资源与区域规划研究所农业部农业信息技术重点实验室, 北京 100081
  • 收稿日期:2015-04-09 修回日期:2015-05-05 出版日期:2015-10-20 发布日期:2015-11-02
  • 通讯作者: 陈锟山(1959-),男,中国台湾人,教授,chenks@radi.ac.cn,主要研究方向为微波遥感. E-mail:chenks@radi.ac.cn
  • 基金资助:
    中国科学院遥感与数字地球研究所所长基金

Model analysis of bistatic scattering from randomly rough surfaces

CHEN Kunshan1,2, LI Zhaoliang2, LIU Yu1   

  1. 1. State Key Laboratory of Remote Sensing Science, Institute of Remote Sensing and Digital Earth, Chinese Academy of Science, Beijing 100101, China;
    2. Key Laboratory of Agri-informatics, Ministry of Agriculture, Institute of Agricultural Resources and Regional Planning, Chinese Academy of Agricultural Sciences, Beijing 100081, China
  • Received:2015-04-09 Revised:2015-05-05 Online:2015-10-20 Published:2015-11-02

摘要: 以先进积分方程模型(AIEM)为工作模型,从理论上系统分析了随机粗糙面的双站散射特征,探讨了不同粗糙程度下散射系数在方位平面上的谷点位置,并利用数值仿真模拟、实测值对理论预测的散射系数进行了说明与验证.结果显示,散射系数在方位向上的谷点位置与粗糙程度和极化特征密切相关.利用数值仿真模拟,可从物理的角度更系统深入地分析统计粗糙表面的散射特性,从而有利于设计以后的更有效的双站探测模式.

关键词: 双站散射, 散射系数, 随机粗糙面, 积分方程模型(IEM), 先进积分方程模型(AIEM), 数值仿真模拟

Abstract: Model analysis was presented of bistatic scattering features from randomly rough surfaces theoretically. In particular, a statistical advanced integral equation model (AIEM) was selected as the working model. The scattering coefficients in the location of the dip in azimuthal plane were investigated for different roughness scale. Theoretical predictions of scattering coefficients were illustrated, demonstrated, and validated by comparisons with numerical simulations, and measurements. The results show that the dip location or region is both rough and polarization dependent. Simulation results offer deeper physical insights into the scattering features of statistically rough surface and thus are useful or even vital for designing future and yet more effective bistatic measurement configurations.

Key words: bistatic scattering, scattering coefficients, randomly rough surfaces, integral equation model (IEM), advanced integral equation model (AIEM), numerical simulation

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