北京航空航天大学学报 ›› 2016, Vol. 42 ›› Issue (2): 328-336.doi: 10.13700/j.bh.1001-5965.2015.0122

• 论文 • 上一篇    下一篇

胚胎电子细胞中基因备份数目优选方法

朱赛, 蔡金燕, 孟亚峰, 潘刚   

  1. 军械工程学院电子与光学工程系, 石家庄 050003
  • 收稿日期:2015-03-09 出版日期:2016-02-20 发布日期:2016-03-01
  • 通讯作者: 孟亚峰,Tel.:0311-87994231 E-mail:radarm@126.com E-mail:radarm@126.com
  • 作者简介:朱赛 男,博士研究生。主要研究方向:电子系统仿生自修复设计。 E-mail:szhumail@163.com;蔡金燕 女,博士,教授,博士生导师。主要研究方向:电子系统可靠性分析与设计、电子系统仿生自修复设计。 E-mail:radarc@126.com;孟亚峰 男,博士,副教授,硕士生导师。主要研究方向:电子系统可靠性分析与设计、电子系统仿生自修复设计。Tel.:0311-87994231 E-mail:radarm@126.com
  • 基金资助:
    国家自然科学基金(61271153,61372039)

Gene backup number selection method for embryonics cell

ZHU Sai, CAI Jinyan, MENG Yafeng, PAN Gang   

  1. Department of Electronic and Optical Engineering, Ordnance Engineering College, Shijiazhuang 050003, China
  • Received:2015-03-09 Online:2016-02-20 Published:2016-03-01

摘要: 分析现有胚胎电子细胞基因存储结构的基础上,考虑基因备份数目对自修复过程的影响,建立了可靠性模型;并根据存储结构的具体实现方式,建立了硬件消耗模型。以可靠性模型和硬件消耗模型为基础,通过分析可靠性、硬件消耗与基因备份数目间的关系,提出了一种基因备份数目优选方法。该方法根据目标电路的可靠性、硬件消耗设计要求,选择兼顾系统可靠性、硬件消耗的基因存储方式、基因备份数目及胚胎电子阵列规模,具有工程应用价值。通过某电路的基因备份数目的选择,对该方法进行了验证。

关键词: 胚胎电子阵列, 基因存储, 基因备份数目, 可靠性, 自修复

Abstract: The existing structures of embryonics cell's genome memory were analyzed, and a reliability model was developed considering the effect of the gene backup number on self-repair process. The hardware overhead model was built depending on the implementations of genome memories. Based on the reliability model and hardware overhead model, the relationship among reliability, hardware overhead and gene backup number was analyzed, and a gene backup number selection method was proposed. The genome memory structure, gene backup number and the size of embryonics array, taking into account the system reliability and hardware overhead, can be selected with the proposed method,according to the design requirement of reliability and hardware overhead of target circuit. So the proposed method can be introduced to the engineering application. At last, the method is verified through a circuit's gene backup number selection.

Key words: embryonics array, genome memory, gene backup number, reliability, self-repair

中图分类号: 


版权所有 © 《北京航空航天大学学报》编辑部
通讯地址:北京市海淀区学院路37号 北京航空航天大学学报编辑部 邮编:100191 E-mail:jbuaa@buaa.edu.cn
本系统由北京玛格泰克科技发展有限公司设计开发