北京航空航天大学学报 ›› 2018, Vol. 44 ›› Issue (2): 349-362.doi: 10.13700/j.bh.1001-5965.2017.0321

• 论文 • 上一篇    下一篇

一种新的胚胎电子细胞阵列测试结构

李丹阳, 蔡金燕, 孟亚峰, 朱赛   

  1. 陆军工程大学石家庄校区 电子与光学工程系, 石家庄 050003
  • 收稿日期:2017-05-15 修回日期:2017-08-11 出版日期:2018-02-20 发布日期:2017-09-18
  • 通讯作者: 蔡金燕,E-mail:cjyrad@163.com E-mail:cjyrad@163.com
  • 作者简介:李丹阳,男,博士研究生。主要研究方向:电子装备故障检测与自修复;蔡金燕,女,教授,博士生导师。主要研究方向:电子系统可靠性分析与设计、电子系统仿生自修复设计等;孟亚峰,男,副教授,硕士生导师。主要研究方向:电子系统可靠性分析与设计、电子系统仿生自修复设计等;朱赛,男,博士,讲师。主要研究方向:仿生电子系统设计及电子系统自修复设计。
  • 基金资助:
    国家自然科学基金(61601495)

A novel testing architecture for embryonics array

LI Danyang, CAI Jinyan, MENG Yafeng, ZHU Sai   

  1. Department of Electronic and Optical Engineering, Army Engineering University Shijiazhuang Campus, Shijiazhuang 050003, China
  • Received:2017-05-15 Revised:2017-08-11 Online:2018-02-20 Published:2017-09-18
  • Supported by:
    National Natural Science Foundation of China (61601495)

摘要: 针对胚胎电子细胞阵列中测试结构与故障检测和定位方法受电子细胞和阵列结构限制较大,故障检测和定位能力有限,硬件消耗大等问题,提出一种由可配置边界扫描结构和可配置内部扫描结构组成的新的测试结构。基于这种测试结构,提出了寄存器传输级故障检测和细胞级故障定位相结合的故障检测和定位方法。仿真实验以s27电路为例,详细介绍了故障检测和定位的具体过程并对测试结构的硬件消耗进行了分析。仿真和分析结果表明,本文方法可有效检测并在细胞级定位故障,而且随着阵列规模增大,测试结构的硬件消耗所占比例明显下降,适用于大规模胚胎电子细胞阵列。

关键词: 胚胎电子细胞阵列, 测试结构, 故障检测, 故障定位, 扫描测试

Abstract: In embryonics array, testing architecture and the fault detection and location method are limited by the electronic cell structure and the array structure. Fault detection and location capability need to be improved, and the hardware consumption of the testing architecture is large. In order to solve these problems, a novel testing architecture composed of configurable boundary scan architecture and configurable inner scan architecture was proposed. Based on this novel architecture, a register transfer level fault detection method and a cell level fault location method were proposed. In the simulation of s27 circuit, the detailed process of fault detection and location is introduced, and the hardware resource consumption of the testing architecture is analyzed. Simulation and analysis results show that the proposed method can effectively detect and locate the fault at cell level, and the proportion of hardware resource consumption of the testing architecture decreases significantly as the size of the embryonics array increases, which is suitable for large-scale embryonics array.

Key words: embryonics array, testing architecture, fault detection, fault location, scan test

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