北京航空航天大学学报 ›› 2018, Vol. 44 ›› Issue (3): 593-604.doi: 10.13700/j.bh.1001-5965.2017.0173

• 论文 • 上一篇    下一篇

基于多态系统的总线胚胎电子阵列可靠性分析

王涛, 蔡金燕, 孟亚峰, 朱赛   

  1. 陆军工程大学石家庄校区电子与光学工程系, 石家庄 050003
  • 收稿日期:2017-03-23 出版日期:2018-03-20 发布日期:2018-03-30
  • 通讯作者: 孟亚峰 E-mail:myfrad@163.com
  • 作者简介:王涛,男,博士研究生。主要研究方向:电子系统故障检测与自修复技术;蔡金燕,女,博士,教授,博士生导师。主要研究方向:电子系统可靠性分析与设计、电子系统仿生自修复技术;孟亚峰,男,博士,副教授,硕士生导师。主要研究方向:电子系统可靠性分析与设计、电子系统仿生自修复技术。
  • 基金资助:
    国家自然科学基金(61372039,61601495)

Reliability analysis of bus-based embryonic electronic array based on multi-state system

WANG Tao, CAI Jinyan, MENG Yafeng, ZHU Sai   

  1. Department of Electronic and Optical Engineering, Army Engineering University Shijiazhuang Campus, Shijiazhuang 050003, China
  • Received:2017-03-23 Online:2018-03-20 Published:2018-03-30
  • Supported by:
    National Natural Science Foundation of China (61372039, 61601495)

摘要: 通过分析总线胚胎电子阵列(BBEEA)的结构特点和工作原理,将多态系统理论引入到阵列的可靠性分析中,采用通用生成函数(UGF)方法建立了阵列的可靠性分析模型。与基于n/k系统的阵列可靠性分析模型进行对比,验证了基于多态系统阵列可靠性分析模型的正确性和有效性。利用建立的阵列可靠性分析模型对总线胚胎电子阵列的可靠性进行分析,根据阵列的可靠性要求指导阵列的结构设计。同时,对比不同规模总线胚胎电子阵列与典型胚胎电子阵列(EEA)的可靠性,分析总线胚胎电子阵列的性能。分析结果表明:建立的阵列可靠性分析模型能够准确有效地分析阵列的可靠性,将阵列的可靠性分析与工作状态相结合,对阵列的结构设计和预防性维修决策具有重要的指导意义。

关键词: 总线胚胎电子阵列(BBEEA), 自修复, 可靠性, 多态系统, n/k系统

Abstract: Through the analysis on structure characteristics and work principle of bus-based embryonic electronic array (BBEEA), the multi-state system theory is introduced to the reliability analysis of BBEEA, and the universal generating function (UGF) was used to model and analyze BBEEA reliability. Compared with BBEEA reliability model based on n/k system, correctness and validity of BBEEA reliability model based on multi-state system are verified. BBEEA reliability is analyzed based on the proposed multi-state system reliability model so as to guide the structure design of BBEEA according to reliability requirement. At the same time, in order to analyze the performance of BBEEA, comparative analysis of reliability between typical embryonic electronic array (EEA) and BBEEA is completed. The results of analysis show that reliability model based on multi-state system can analyze BBEEA reliability in nature, and it can associate working states and reliability of BBEEA, which has great guiding significance on structure design and preventive maintenance decision of BBEEA.

Key words: bus-based embryonic electronic array(BBEEA), self-repair, reliability, multi-state system, n/k system

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