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�������պ����ѧѧ�� 2006, Vol. 32 Issue (04) :430-434    DOI:
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������1, ������1, ����2*
1. �������պ����ѧ ����ϵͳ����ϵ, ���� 100083;
2. �������պ����ѧ ��е���̼��Զ���ѧԺ, ���� 100083
Fault injection system design based on BIT
Zhang Xiaojie1, Wang Xiaofeng1, Jin Man2*
1. Dept. of System Engineering of Engineering Technology, Beijing University of Aeronautics and Astronautics, Beijing 100083, China;
2. School of Mechanical Engineering and Automation, Beijing University of Aeronautics and Astronautics, Beijing 100083, China

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Abstract�� With the deep research and comprehensive application of BIT(built-in test), exigent demands for the validation and estimate have been brought forward, and this field becomes a new focus on research. Testing the performance of BIT through fault-injection is an effective method to validate its testing level. Based on integrating the relevant domestic and foreign materials, the importance, imminence and practicality of the validation and evaluation of BIT have been analyzed in detail. The design and implementation of fault injection system have been particularly expatiated. Then the block diagram of gross structure, relation diagram of each mold in the system and working process chart of the system implementation have been presented. On the basis of the design and performance of hardware/software, primary experiment of BIT validation had been processed; a certain quantity of fault was injected into tested circuit in order to verify the validity. The result of experiment indicates that the system of fault-injection can suffice the request of BIT design.
Keywords�� fault injection   fault diagnosis   testability   built-in test     
Received 2005-04-18;
About author: ������(1977-),��,ɽ����Ȫ��,˶ʿ��, zxj-1@sohu.com.
������, ������, ����.���ڻ��ڲ��ԵĹ���ע��ϵͳ���[J]  �������պ����ѧѧ��, 2006,V32(04): 430-434
Zhang Xiaojie, Wang Xiaofeng, Jin Man.Fault injection system design based on BIT[J]  JOURNAL OF BEIJING UNIVERSITY OF AERONAUTICS AND A, 2006,V32(04): 430-434
http://bhxb.buaa.edu.cn//CN/     ��     http://bhxb.buaa.edu.cn//CN/Y2006/V32/I04/430
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