基于S型测试工作量函数的软件可靠性增长模型

李秋英; 李海峰; 陆民燕; 王学成

基于S型测试工作量函数的软件可靠性增长模型

北京航空航天大学可靠性与系统工程学院, 北京 100191

详细信息

作者简介:
李秋英(1973-),女,黑龙江大庆人,讲师,li_qiuying@buaa.edu.cn.

中图分类号: TP 311
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- 文章访问数: 3132
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- 被引次数: 0
出版历程
- 收稿日期: 2010-07-13
- 网络出版日期: 2011-02-28

Software reliability growth model with S-shaped testing effort function

School of Reliability and Systems Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100191, China

摘要

摘要: 软件测试工作量随时间的变化情况对于软件可靠性增长曲线的形状具有显著影响,因此将测试工作量函数(TEF,Testing Effort Function)引入软件可靠性增长模型(SRGM,Software Reliability Growth Model)中以提高软件可靠性评估性能.分析了软件结构特征及学习因素对实际测试过程的综合影响,研究增长速率为先增后减的S型增长趋势的TEF,提出两种S型TEF,即延迟S型TEF与变形S型TEF,并提出考虑延迟S型TEF的SRGM(DSTEF-SRGM)以及变形S型TEF的SRGM(ISTEF-SRGM).在两组真实失效数据集上,进行了这两种SRGM与经典SRGM及其它考虑TEF的SRGM的对比研究.结果表明,ISTEF-SRGM的模型拟合效果最优,同时验证了该模型具有优越的软件可靠性评估性能及模型适应性.
- 软件可靠性 /
- 测试 /
- 可靠性分析 /
- 增长 /
- 模型
Abstract: The shape of the observed reliability growth curve depends strongly on the time distribution of the testing effort. Thus, the reliability estimation power of software reliability growth model (SRGM) can be improved by considering the testing effort function (TEF). Due to the integrated effects of software structure and learning factor on testing process, testing effort increasing rate may exhibit an S-shaped varying trend first increasing and then decreasing. To accurately describe this S-shaped varying trend, two S-shaped testing effort functions were proposed first, i.e. delayed S-shaped TEF and inflected S-shaped TEF, which were simple and flexible. Then two new SRGMs were put forward by combining two S-shaped TEFs into SRGM, i.e. DSTEF-SRGM and ISTEF-SRGM. Finally, for two real failure data-sets, the case study was done by comparing these two S-shaped TEF-SRGMs with several classical SRGMs and other representative SRGMs considering TEF in the form of estimation power. The result shows that compared with these comparison models, the proposed ISTEF-SRGM has the best fitting results on each data-set. In other words, the proposed ISTEF-SRGM provides novel applicability and a significantly better power of reliability estimation.
- software reliability /
- testing /
- reliability analysis /
- growth /
- models

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参考文献(1)

[1] Lyu M R.Handbook of software reliability engineering [M].New York:McGraw Hill,1996 [2] Gokhale S S,Lyu M R.A simulation approach to structure-based software reliability analysis [J].IEEE Trans on Software Engineering,2005,31(8):643-656 [3] Pham H.Software reliability [M].Singapore:Springer-Verlag,2000 [4] Gana A,Huang S T.Statistical modeling applied to managing global 5ess-2000 switch software development [J].Bell Labs Technical Journal,1997,2(1):144-153 [5] Kruger G A.Validation and further application of software reliability growth models [J].Hewlett-Packard Journal,1989,40(4):75-79 [6] Huang C Y,Kuo S Y,Michael R L.An assessment of testing-effort dependent software reliability growth models [J].IEEE Transactions on Reliability,2007,56(2):198-211 [7] Shibata K,Rinsaka K,Dohi T.Metrics-based software reliabil-ity models using non-homogeneous Poisson processes [C] // Proc of the 17^th IEEE International Symposium on Software Reliability Engineering.Washington DC:IEEE Computer Society,2006:52-61 [8] 谢景燕,安金霞,朱纪洪.考虑不完美排错情况的NHPP类软件可靠性增长模型[J].软件学报,2010,21(5):942-949 Xie J Y,An J X,Zhu J H.NHPP software reliability growth model considering imperfect debugging[J].Journal of Software,2010,21(5):942-949 (in Chinese) [9] Kuo S Y,Huang C Y,Michael R L.Framework for modeling software reliability,using various testing-efforts and fault-detection rates [J].IEEE Transactions on Reliability,2001,50(3):310-320 [10] Norman E F,Martin N.A critique of software defect prediction models [J].IEEE Transactions on SoftwareEngineering.1999,25(5):675-689 [11] Huang C Y.Analysis of incorporating logistic testing-effort function into software reliability modeling [J].IEEE Transactions on Reliability,2002,51(3):261-270 [12] Musa J D,Iannino A.Software reliability,measurement,prediction and application [M].New York:McGraw Hill,1987 [13] Yamada S,Hishitani J,Osaki S.Software reliability growth model with Weibull testing effort:a model and application [J].IEEE Transactions on Reliability,1993,42(1):100-106 [14] Ahmad N,Bokhari M U,Quadri S M K,et al.The exponentiated Weibull software reliability growth model with various testing-efforts and optimal release policy [J].International Journal of Quality & Reliability Management,2008,25(2):211-235 [15] Quadri S M K.Non homogeneous Poisson process software reliability growth model with generalized exponential testing effort function [J].RAU Journal of Research,2006,16(2):159-163 [16] Ahmad N,Khan M G M,Quadri S M K,et al.Modeling and analysis of software reliability with Burr type X testing-effort and release-time determination [J].Journal of Modeling in Management,2009,4(1):28-54 [17] Huang C Y.Cost-reliability-optimal release policy for software reliability models incorporating improvements in testing efficiency [J].The Journal of Systems and Software,2005,77:139-155 [18] Huang C Y.Optimal release time for software systems considering cost,testing-effort,and test efficiency [J].IEEE Transactions on Reliability,2005,54(4):583-591 [19] Bokhari M U,Ahmad N.Analysis of a software reliability growth models:the case of log-logistic test-effort function [C]//Proceedings of the 17^th International Conference on Modeling and Simulation.Montreal,Canada:Acta Press,2006:540-545 [20] Chatterjee S,Misra R B,Alam S S.Joint effect of test effort and learning factor on software reliability and optimal release policy [J].International Journal of System Science,1997,28(4):391-396 [21] Ahmad N,Khan M G M.A study of testing-effort dependent inflection S-shaped software reliability growth models with imperfect debugging [J].International Journal of Quality & Reliability Management,2010,27(1):89-110 [22] Jha P C,Gupta D,Yang B,et al.Optimal testing resource allocation during module testing considering cost,testing effort and reliability [J].Computers & Industrial Engineering,2009,57:1122-1130 [23] Lin C T,Huang C Y.Enhancing and measuring the predictive capabilities of testing-effort dependent software reliability models [J].The Journal of Systems and Software,2008,81:1025-1038 [24] Huang C Y.Performance analysis of software reliability growth models with testing-effort and change-point [J].The Journal of Systems and Software,2005,76:181-194 [25] Kapur P K,Gupta A.Testing effort control using flexible software reliability growth model with change point [J].International Journal of Performability Engineering,2006,2(3):245-262 [26] Lin C T,Huang C Y,Chang J R.Integrating generalized Weibull-type testing-effort function and multiple change-points into software reliability growth models[C]//12th Asia-Pacific Software Engineering Conference.Los Alamitos:IEEE Computer Society,2005:431-438 [27] Kapur P K,Goswami D N,Amit B,et al.Flexible software reliability growth model with testing effort dependent learning process [J].Applied Mathematical Modeling,2008,32:1298-1307 [28] Kapur P K,Grover P S.Modelling an imperfect debugging phenomenon with testing effort [C]//Proceedings of the 4^th Software Reliability Engineering.Los Alamitos:IEEE,1994:178-183 [29] Kapur P K,Omar S,Anu G A,et al.Unified framework for developing testing effort dependent software reliability growth models [J].WSEAS Transactions on Systems,2009,4(8):521-531 [30] Yamada S,Ohba M,Osaki S.S-shaped software reliability growth models and their applications [J].IEEE Trans on Reliability,1984,R-33(4):289-292 [31] Ohba M.Inflection S-shaped software reliability growth models [M].Stochastic Models in Reliability Theory.Berlin:Springer,1984:144-162 [32] Su Y S,Huang C Y.Neural-network-based approaches for software reliability estimation using dynamic weighted combinational models[J].The Journal of Systems and Software,2007,80:606-615 [33] Yamada S,Tokuno K,Osaki S.Imperfect debugging models with fault introduction rate for software reliability assessment[J].International Journal of Systems Science,1992,23(12):2241-2252

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