Parametric faults detecting with multi-frequency test applied in ATE
-
摘要: 从线性模拟电路灵敏度的概念入手,分析了通过获取敏感频点激励下的最大故障误差来检测电路参数故障的可能性,提出了一种针对测试频率和测点信息的激励矩阵.设计了适合自动测试系统进行模拟电路参数故障检测的联合激励方式提取算法以降低测试成本.仿真结果所给出的故障检测效果显示,该方法可以放大故障误差,并有助于利用敏感频点响应的差别来辨别故障信号.Abstract: Assisted with the sensitivity of the linear analog circuits, the feasibility of parametric faults detection was analyzed through the maximum fault errors acquired at the sensitive frequencies, a stimulation matrix and its stimulation expression were put forward on the test points information. A united stimulation acquisition algorithm was designed for detecting the faulty circuits under automatic test equipment in order to decrease the test cost. The fault detection effect illustrated in the simulation result shows that this method can magnify the fault errors, and help discriminate the faulty signals according to their sensitive frequency responses under different test points.
-
Key words:
- sensitivity /
- fault detection /
- sensitive frequency /
- united stimulation
-
[1] Slamani M. Analog circuit fault diagnosis based on sensitivity computation and functional testing[J]. IEEE Design & Test of Computers, 1992, 9(1):30~39 [2]士先,杜裕曾. 电路分析[M]. 北京:北京航空航天大学出版社,1988.174~175 Pan Shixian, Du Yuzeng. Circuits analysis[M]. Beijing:Beijing University of Aeronautics and Astronautics Press,1988.174~175(in Chinese) [3]agi N, Balivada A. Efficient multisine testing of analog circuits . Proceedings of the 8th International Conference on VLSI Design . Los Alamitos:IEEE Computer Society Press, 1995.234~238 [4]Nagi N. A comprehensive test framework for analog and mixed-signal circuits . Austin:University of Texas at Austin, 1994 [5]Goel P. An implicit enumeration algorithm to generate tests for combinational logic circuits[J].IEEE Transactions on Computers, 1981, 30(3):215~222 -
点击查看大图
计量
- 文章访问数: 2552
- HTML全文浏览量: 146
- PDF下载量: 829
- 被引次数: 0
下载:
