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Volume 32 Issue 02
Feb.  2006
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Journal of Beijing University of Aeronautics and Astronautics  > 2006  >  32(02): 181-185.
Zhao Ruixian, Meng Xiaofeng, Wang Guohuaet al. General-utility testing path model of switches for ATE and application[J]. Journal of Beijing University of Aeronautics and Astronautics, 2006, 32(02): 181-185. (in Chinese)
Citation: Zhao Ruixian, Meng Xiaofeng, Wang Guohuaet al. General-utility testing path model of switches for ATE and application[J]. Journal of Beijing University of Aeronautics and Astronautics, 2006, 32(02): 181-185. (in Chinese)
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General-utility testing path model of switches for ATE and application

  • School of Instrument Science and Opto-electronics Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100083, China

  • Received Date: 03 Dec 2004
  • Publish Date: 28 Feb 2006
    Abstract
  • In order to solve the questions such as searching testing path, judging testing path conflict and managing testing path of switches during the course of programming testing programs (TP) of automation testing equipment (ATE), a general-utility testing path model of switches was brought forward, the model general description and interlink algorithm for much more switches connecting were presented, and the material application methods of the model was introduced. The automated searching of optimum testing path and judging of testing path conflict are realized, the fault of testing path can be isolated well and TP are not related to the material path hardware by the model means. Accordingly the general-utility and replantability of TP are improved, and the workload of programming TP is reduced.

     

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  • [1] Orlet J L, Murdock G L. NxTest augments legacy military ATE [J] Aerospace and Electronic Systems Magazine, IEEE ,2002, 17:17~20 [2] Ramachandran N, Oblad R P, Neag I A, et al. The role of a signal interface in supporting instrument interchangeability . In:Autotestcon Proceedings . Anaheim, 2000.403~416 [3] Gal S, Neag I A. A unified interface for signal-oriented control of instruments and switches . In:Autotestcon Proceedings . Huntsville,2002.337~350 [4] Fertitta K, Eriksson D. The state of interchangeability in ATE . In:Autotestcon Proceedings . Anaheim,2000.417~424 [5] Stora M J, Droste D. "ATE open system platform" IEEE-P1552 structured architecture for test systems . In:IEEE Systems Readiness Technology Conference . Anaheim,2003.85~94
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