Advanced Search
Volume 38 Issue 10
Oct.  2012
Turn off MathJax
Article Contents
Journal of Beijing University of Aeronautics and Astronautics  > 2012  >  38(10): 1285-1289.
Song Ningfang, Qin Jiaomei, Pan Xiong, et al. Evaluating SEU effects in SRAM-based FPGA with bit-by-bit upset fault injection[J]. Journal of Beijing University of Aeronautics and Astronautics, 2012, 38(10): 1285-1289. (in Chinese)
Citation: Song Ningfang, Qin Jiaomei, Pan Xiong, et al. Evaluating SEU effects in SRAM-based FPGA with bit-by-bit upset fault injection[J]. Journal of Beijing University of Aeronautics and Astronautics, 2012, 38(10): 1285-1289. (in Chinese)
shu

Evaluating SEU effects in SRAM-based FPGA with bit-by-bit upset fault injection

  • 1.

    School of Instrument Science and Opto-electronics Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100191, China

  • 2. The Second Artillery Equipment Academy, Beijing 100085, China

  • Received Date: 07 Sep 2011
  • Publish Date: 30 Oct 2012
    Abstract
  • Static random access memory (SRAM)-based field programmable gate arrays (FPGAs) are extremely sensitive to single event upsets (SEUs) induced by radiation particles. In order to evaluate the dependability of the obtained designs, a bit-by-bit upset fault injection methodology based on run-time reconfiguration was proposed. The methodology can detect the sensitive bits in various logic designs. The configuration memories’ dynamic cross section, failure rate and reliability change curve can be counted with the number of sensitive bits. The reliability parameters and curves of triple modular redundancy (TMR) multiplier and non-TMR multiplier were obtained with this method, and the correctness of sensitive bits was validated.

     

    • FullText(HTML)
  • loading
    • References(8)
  • [1]
    费尔南达·利马·卡斯腾斯密得,路易吉·卡罗,里卡多·赖斯.基于SRAM的FPGA容错技术[M].杨孟飞,龚健,文亮,等译.北京:中国宇航出版社,2009:1-8 Fernanda L K,Luigi C,Ricardo R.Fault-tolerance techniques for SRAM-based FPGAs[M].Translated by Yang Mengfei,Gong Jian,Wen Liang,et al.Beijing:China Astronautic Publishing House,2009:1-8(in Chinese)
    [2]
    齐鑫,冯文全.基于动态重配置的SEU故障检测与修复系统的设计 //方滨兴.中国通信学会第六届学术年会论文集.广州:中国通信学会,2009:82-87 Qi Xin,Feng Wenquan.The design of a SEU fault detection and recovery system based on dynamic reconfiguration //Fang Binxing.The Sixth Conference Proceedings of China Communications Association.Guangzhou:China Institute of Communications,2009:82-87(in Chinese)
    [3]
    Leveugle R,Antoni L,Feher B.Dependability analysis:a new application for run-time reconfiguration //Amaral J N.Proceedings of the International Parallel and Distributed Processing Symposium (IPDPS).Los Alamitos:IEEE Computer Society Press,2003:345-351
    [4]
    Johnson E,Caffrey M P,Graham P S,et al.Accelerator validation of an FPGA SEU simulator[J].IEEE Transactions on Nuclear Science,2003,50(6):2147-2157
    [5]
    Morgan K S,McMurtrey D L,Pratt B H,et al.A comparison of TMR with alternative fault-tolerant design techniques for FPGAs[J].IEEE Transactions on Nuclear Science,2007,54(6):2065-2072
    [6]
    Quinn H M,Graham P S,Morgan K S,et al.An introduction to radiation-induced failure modes and related mitigation methods for Xilinx SRAM FPGAs //Plaks T P.Proceedings of the International Conference on Engeering of Reconfigurable Systems Algorithms(ERSA).Las Vegas:CSREA Press,2008:139-145
    [7]
    Yui C,Swift C,Carmichael C.Singel event upset susceptibility testing of the Xilinx Virtex Ⅱ FPGA //Katz R B.Military and Aerospace Applications of Programmable Devices and Technologies Conference (MAPLD).Washington D C:Kossiakoff Conference Center,2002:212-217
    [8]
    Quinn H M,Graham P S,Wirthlin M J,et al.A test methodology for determining space readiness of Xilinx SRAM-Based FPGA devices and designs[J].IEEE Transactions on Instrumentation and Measurement,2009,58(10):3380-3395
    • Relative Articles
    • Supplements(0)
    • Cited By
  • 加载中

Catalog

    通讯作者: 陈斌, bchen63@163.com
    • 1. 

      沈阳化工大学材料科学与工程学院 沈阳 110142

    1. 本站搜索
    2. 百度学术搜索
    3. 万方数据库搜索
    4. CNKI搜索
    Get Citation
    PDF
    XML

    Article Metrics

    Article views(2438) PDF downloads(806) Cited by()
    Proportional views
    Related

    Copyright © Journal of Beijing University of Aeronautics and Astronautics

    Address: Editorial Department of Journal of Beijing University of Aeronautics and Astronautics, 37 Xueyuan Road, Haidian District, Beijing Post Code: 100191 Email: jbuaa@buaa.edu.cn

    Supported by: Beijing Renhe Information Technology Co., Ltd.    

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return