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 引用本文: 王前程, 陈云霞, 邓沣鹂, 等 . 加速度计加速退化机理一致性边界确定方法[J]. 北京航空航天大学学报, 2012, (11): 1512-1516.
Wang Qiancheng, Chen Yunxia, Deng Fengli, et al. Approach of determining accelerated degradation mechanism consistency’s boundary for accelerometers[J]. Journal of Beijing University of Aeronautics and Astronautics, 2012, (11): 1512-1516. (in Chinese)
 Citation: Wang Qiancheng, Chen Yunxia, Deng Fengli, et al. Approach of determining accelerated degradation mechanism consistency’s boundary for accelerometers[J]. Journal of Beijing University of Aeronautics and Astronautics, 2012, (11): 1512-1516. (in Chinese)

加速度计加速退化机理一致性边界确定方法

• 中图分类号: V241.4

Approach of determining accelerated degradation mechanism consistency’s boundary for accelerometers

• 摘要: 以加速退化模型——Arrhenius模型为研究对象,发现加速度计在加速试验过程中,保持加速机理不变的应力与退化轨迹斜率存在密切关系.通过针对退化轨迹模型分别为一次函数、指数函数和幂函数三种常见情况,从激活能不变角度推导出保证加速度计加速机理不变的应力-斜率公式,然后基于退化轨迹斜率区间检验提出了一种加速机理一致性条件确定方法,最后根据加速度计恒定高温标度因数稳定性退化仿真试验数据,准确得到了保持加速度计标度因数稳定性退化机理一致的应力边界,验证了该方法的可行性.

•  [1] Michele Boulanger Carey,Reed H Koenig.Reliability assessment based on accelerated degradation a case study[J].IEEE Transaction on Reliability,1991,40(5):499-506 [2] William Q Meeker,Michael Hamada.Statistical tools for the rapid development & evaluation of high-reliability products[J].IEEE Transaction on Reliability,1995,44(2):187-198 [3] Meeker W Q,Escobar L A,Lu J C.Accelerated degradation tests:modeling and analysis[J].Technometrics,1998,40(2):89-99 [4] 李秀宇.快速评价半导体器件可靠性的新方法 [D].北京:北京工业大学电子信息与控制工程学院,2007 Li Xiuyu.A new method of rapid evaluation of the reliability of semiconductor devices [D].Beijing:College of Electronic Information and Control Engineering,Beijing University of Technology,2007(in Chinese) [5] 姜仁元,张兴唐,杨亦春.温度应力下功能退化型加速寿命试验问题研究[J].南京理工大学学报,2000,24(6):523-527 Jiang Renyuan,Zhang Xingtang,Yang Yichun.Study on accelerated life test of function degenerating type by temperature stress[J].Journal of Nanjing University of Science and Technology,2000,24(6):523-527(in Chinese) [6] 林震,姜同敏,程永生,等.阿伦尼斯模型研究[J].电子器件可靠性与环境试验,2005,23(6):12-14 Lin Zhen,Jiang Tongmin,Cheng Yongsheng,et al.Study on Arrhenius relationship[J].Electronic Product Reliability and Environmental Testing,2005,23(6):12-14(in Chinese) [7] 郭春生,谢雪松,马卫东,等.加速试验中失效机理一致性的判别方法[J].半导体学报,2006,27(3):560-563 Guo Chunsheng,Xie Xuesong,Ma Weidong,et al.A failure-mechanism identification method in accelerated testing[J].Chinese Journal of Semiconductors,2006,27(3):560-563(in Chinese) [8] 王召斌,任万滨,翟国富.加速退化试验与加速寿命试验技术综述[J].低压电器,2010,9:1-6 Wang Zhaobin,Ren Wanbin,Zhai Guofu.Review of accelerated degradation testing and accelerated life testing[J].Low Voltage Apparatus,2010,9:1-6(in Chinese) [9] 郑德强,张正平,李海波,等.加速退化试验技术研究、应用与发展[J].装备环境工程,2011,8(2):100-104 Zheng Deqiang,Zhang Zhengping,Li Haibo,et al.Research,application and development of accelerated degradation test technology[J].Equipment Environmental Engineering,2011,8(2):100-104(in Chinese) [10] 韩於羹.应用数理统计[M].北京:北京航空航天大学出版社,2006:165-168 Han Yugeng.Application of mathematical statistics[M].Beijing:Beijing University of Aeronautics and Astronautics Press,2006:165-168(in Chinese)

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出版历程
• 收稿日期:  2011-06-21
• 刊出日期:  2012-11-30

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