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SRAM型FPGA单粒子翻转效应加固方法

姜昱光 韩建伟 朱翔 蔡明辉

姜昱光, 韩建伟, 朱翔, 等 . SRAM型FPGA单粒子翻转效应加固方法[J]. 北京航空航天大学学报, 2014, 40(8): 1073-1077. doi: 10.13700/j.bh.1001-5965.2013.0514
引用本文: 姜昱光, 韩建伟, 朱翔, 等 . SRAM型FPGA单粒子翻转效应加固方法[J]. 北京航空航天大学学报, 2014, 40(8): 1073-1077. doi: 10.13700/j.bh.1001-5965.2013.0514
Jiang Yuguang, Han Jianwei, Zhu Xiang, et al. Single event upset mitigation testing of SRAM-based FPGAs[J]. Journal of Beijing University of Aeronautics and Astronautics, 2014, 40(8): 1073-1077. doi: 10.13700/j.bh.1001-5965.2013.0514(in Chinese)
Citation: Jiang Yuguang, Han Jianwei, Zhu Xiang, et al. Single event upset mitigation testing of SRAM-based FPGAs[J]. Journal of Beijing University of Aeronautics and Astronautics, 2014, 40(8): 1073-1077. doi: 10.13700/j.bh.1001-5965.2013.0514(in Chinese)

SRAM型FPGA单粒子翻转效应加固方法

doi: 10.13700/j.bh.1001-5965.2013.0514
基金项目: 

国家自然科学基金资助项目(40974113);中国科学院知识创新工程青年基金资助项目(O82111A17S);基础科研资助项目(A1320110028);中国科学院支撑技术资助项目(110161501038)

详细信息
    作者简介:

    姜昱光(1986-),男,山东烟台人,博士生,jiangyuguang@nssc.ac.cn.

  • 中图分类号: V524.3

Single event upset mitigation testing of SRAM-based FPGAs

  • 摘要: 应用重离子加速器和皮秒脉冲激光器开展Virtex-Ⅱ FPGA(Field Programmable Gate Array)单粒子效应加固方法有效性研究.实验结果表明,同时应用三模冗余和动态刷新加固方法能够完全纠正单粒子效应产生的功能错误.实验获得数据加密算法在不同单粒子效应加固方法下功能错误截面,发现少量的存储位翻转就可以导致程序功能错误;程序功能对存储位翻转较敏感.分析Virtex-Ⅱ FPGA不同加固方法在不同卫星轨道的有效性,同时应用动态刷新和三模冗余加固方法,可以完全校正由于存储位翻转造成的功能错误.重离子加速器和脉冲激光器实验结果同时表明,脉冲激光可以模拟重离子加速器研究单粒子效应加固方法有效性.

     

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出版历程
  • 收稿日期:  2013-09-04
  • 刊出日期:  2014-08-20

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