Volume 31 Issue 12
Dec.  2005
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Sun Yufeng, Yang Libo, Zhao Guangyanet al. Circuit functional reliability simulation based on grid[J]. Journal of Beijing University of Aeronautics and Astronautics, 2005, 31(12): 1337-1341. (in Chinese)
Citation: Sun Yufeng, Yang Libo, Zhao Guangyanet al. Circuit functional reliability simulation based on grid[J]. Journal of Beijing University of Aeronautics and Astronautics, 2005, 31(12): 1337-1341. (in Chinese)

Circuit functional reliability simulation based on grid

  • Received Date: 13 Oct 2004
  • Publish Date: 31 Dec 2005
  • The functional reliability simulation (FRS) is an advanced integrative simulation and analysis technology in reliability by integrating functional simulation with reliability analysis of system. The architecture and functions and mostly realization methods were discussed, such as failure modeling, virtual failure rejection, simulator integration, failure automatic criterion about FRS. In order to resolve the problems about simulation time and data storage, a new architecture was put forward, which is based on the grid technology, and the related service of simulation, analysis, data management and so on was represented. The grid provides a virtual capability of computing and storage. The new architecture shortens the simulation time and realizes the distributed data storage. The Tyrensgrid circuit functional reliability simulation(TG-CFRS) system was produced based on the idea, which makes the Tyrensgrid as the grid platform and PSpice as the simulation kernel and proves the availability of the new architecture.

     

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  • [1] 孙宇锋. 功能可靠性仿真技术研究 . 北京:北京航空航天大学工程系统工程系, 2000 Sun Yufeng. Study on functional reliability simulation technique . Beijing:Dept of System Engineering of Engineering Technology, Beijing University of Aeronautics and Astronautics, 2000(in Chinese) [2]  Rao R, Rahman A, Johnson B W. Reliability analysis using the ADEPT-REST interface . In:Loomis R J. Proceedings of the Reliability and Maintainability Symposium . Anaheim, California:IEEE, 1994. 73~81 [3]  Dugan J B, Venkataraman B. DIFtree:a software package for the analysis of dynamic fault tree models . In:Mcafee N J. Proceedings of the Reliability and Maintainability Symposium . Philadelphia, Pennsylvania:IEEE, 1997. 64~70 [4] Sun Yufeng. Circuit integrated design of performance and reliability based on EDA . The 6th International Conference on Reliability Maintainability & Safety . Beijing:Hua Xia Publishing House, 2004. 446~452 [5] Palumbo D L. Automating failure modes and effects analysis . In:Loomis R J. Proceeding of the Reliability and Maintainability Symposium . Anaheim, California:IEEE, 1994. 304~309 [6]  Yellman T W. Event-sequence analysis . In:Webster L R. Proceedings of the Reliability and Maintainability Symposium . Washington, DC:IEEE, 1975. 286~291 [7] Zhao Guangyan, Wu Yue, Sun Yufeng. Circuit fault simulation based on EDA . The 6th International Conference on Reliability Maintainability & Safety . Beijing:Hua Xia Publishing House, 2004. 784~779 [8] Foster I, Kesselman C. The grid:blueprint for a new computing infrastructure[M]. San Francisco:Morgan Kaufmann Publishers, 1998 [9]   都志辉, 陈\ 渝, 刘\ 鹏. 网格计算[M]. 北京:清华大学出版社, 2002 Du Zhihui, Chen Yu, Liu Peng. The grid computing[M]. Beijing:Tsinghua University Press, 2002 (in Chinese) [10]  Foster I, Kesselman C. Globus:a metacomputing infrastructure tookit[J]. International Journal of Supercomputer Applications, 1998, 11(2):115~129 [11]  徐志伟, 李晓林, 游赣梅. 织女星信息网格的体系结构研究[J]. 计算机研究与发展, 2002, 39(8):948~951 Xu Zhiwei, Li Xiaolin, You Ganmei. The research on architecture of Vega information grid[J]. Journal of Computer Research and Development, 2002, 39(8):948~951(in Chinese)
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