Volume 30 Issue 02
Feb.  2004
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Zhang D, an. Discussion about seal test of electronics in GJB[J]. Journal of Beijing University of Aeronautics and Astronautics, 2004, 30(02): 173-176. (in Chinese)
Citation: Zhang D, an. Discussion about seal test of electronics in GJB[J]. Journal of Beijing University of Aeronautics and Astronautics, 2004, 30(02): 173-176. (in Chinese)

Discussion about seal test of electronics in GJB

  • Received Date: 16 Oct 2002
  • Publish Date: 29 Feb 2004
  • The problems about sealing test of electronics in GJB were analyzed. Improved methods were presented, which provide the references for controlling theseal quality of military products scientifically. Failure data from a seal test processed by some factory are given to illustrate the importance of strictly controlling test conditions.

     

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  • [1] GJB 548-88,微电子器件试验方法和程序[S]JB 548-88,Experiment method and process of microelectronics[S](in Chinese) [2] GJB 548A-96,微电子器件试验方法和程序[S]JB 548A-96,Experiment method and process of microelectronics[S](in Chinese) [3] MIL-STD-883E,METHOD 1014.9 SEAL[S] [4] 李根成.空空导弹系统可靠性试验现状及建议[J].军用标准化,2002,(1):46~48 Li Gencheng.Status in quo of reliability experiments for air-to-air missile system and some advices[J].Military Standardization,2002,(1):46~48(in Chinese) [5] 胡 燕.新时期我国军用电子元器件标准化工作的改革与实践[J].军用标准化,2002,(1):14~17 Hu Yan.Reformation and practice of standardization work for electronics in the new times[J].Military Standardization,2002,(1):14~17(in Chinese) [6] 刘玉岱.真空测量与检漏[M].北京:冶金工业出版社,1992 Liu Yudai.Vacuum-measurement and leak hunting[M].Beijing:Metalworking Industry Press,1992(in Chinese)
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