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Volume 28 Issue 2
Feb.  2002
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Journal of Beijing University of Aeronautics and Astronautics  > 2002  >  28(2): 190-193.
LI Cheng-gui, LI Xing-shan. Characterization of 3-D Surface Topography by Root-Mean-Square Wavelengt[J]. Journal of Beijing University of Aeronautics and Astronautics, 2002, 28(2): 190-193. (in Chinese)
Citation: LI Cheng-gui, LI Xing-shan. Characterization of 3-D Surface Topography by Root-Mean-Square Wavelengt[J]. Journal of Beijing University of Aeronautics and Astronautics, 2002, 28(2): 190-193. (in Chinese)
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Characterization of 3-D Surface Topography by Root-Mean-Square Wavelengt

  • Beijing University of Aeronautics and Astronautics, School of Automation Science and Electrical Engineering

  • Received Date: 20 Jun 2000
  • Publish Date: 28 Feb 2002
    Abstract
  • Based on fractal geometry theory, a root-mean-square(RMS) wavelength method was proposed to quantitatively evaluate a 3D stochastic surface topography, by means of the surface spectral moments. Through DFT of the profile measured by a Talysurf-10 contact stylus instrument, we obtained the power spectrum and thefractal dimension of the profile. Further, the zero and 2nd order spectral moments of the profile and the surface were obtained. Using these parameters, the evaluation of RMS wavelength was conducted. By experiments for ground samples, the validity of the present method was confirmed.

     

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  • [1]Dong W P, Sullivan P J, Stout K J. Comprehensive study of parameters for characterization 3-D surface topography-III[J]. Wear, 1994,178(1):29~43．  [2]Dong W P, Sullivan P J, Stout K J. Comprehensive study of parameters for characterization 3-D surface topography-IV[J]. Wear, 1994,178(1):45~60．  [3]强锡富,毛起广. 表面粗糙度及其测量译文集[M]. 北京:中国计量出版社, 1987.  [4]李成贵,张国雄,袁长良. 三维表面粗糙度的等方性评定[J]. 机械工程学报,1999,35(1):15~19．  [5]Majumdar A, Tien C L. Fractal characterization and simulation of rough surfaces[J]. Wear, 1990,136(2):313~317．  [6]Thomas T R. Rough surface[M]. New York:Longman Press, 1982.
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