Study on sufficiency of sample set in testability demonstration based on information model
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摘要: 建立了产品的故障模式信息模型,包括产品的故障模式、结构单元、功能和测试数据以及这些数据之间的映射关系.根据该信息模型,定义了三种故障模式等价集合,即故障模式单元等价集合、故障模式功能等价集合、故障模式测试等价集合.在这些等价集合的基础上,建立了测试性试验中样本集的三种典型充分性度量和准则,即单元覆盖充分性度量和准则、功能覆盖充分性度量和准则、测试覆盖充分性度量和准则.分析了典型充分性度量和准则的适用范围,并建立了综合充分性度量和准则.使用综合充分性度量可以评价样本集的充分程度,使用综合充分性准则可以确定样本集的构成要求.建立了综合充分性度量和准则的应用方法和流程.通过实例验证了该方法的可行性.Abstract: The failure mode information model of the product was created. This information model contained the failure mode data, the structural unit data, the function data, the test data and the mapping relation about them. According to this information model, three types’ failure mode equivalence sets were defined. They were the failure mode unit-equivalence set, the failure mode function-equivalence set and the failure mode test-equivalence set. Based on these failure mode equivalence sets, three types of classical sufficiency measurements and criterions for the sample set in the testability demonstration were defined. They were the unit-coverage sufficiency measurement and criterion, the function-coverage sufficiency measurement and criterion and the test-coverage sufficiency measurement and criterion. The application’s scopes of them were analyzed, and the integrated sufficiency measurements and criterions were established. The integrated sufficiency measurement could be used to evaluate the sufficient degree of the sample set. The integrated sufficiency criterion could be used to determine the required structure of sample set. The application’s method and flow for the integrated adequacy measurement and criterion were established. A case indicates that the method is feasible.
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Key words:
- failure mode /
- sample set /
- information model /
- test /
- sufficiency
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[1] 徐忠伟,周玉芬,徐松涛,等.测试性验证中抽样方案的精确算法及应用[J].航空学报, 2000, 21(1):67~69 Xu Zhongwei, Zhou Yufen, Xu Songtao, et al. Accurate algorithm of sampling plan & its application in testability demonstration[J]. ACTA Aeronautica ET Astronautica SINICA, 2000, 21(1):67~69(in Chinese) [2] GJB 2072-1994,维修性试验与评定[S] JB 2072-1994, Maintainability test and evaluation[S] in Chinese) [3] 田 仲,石君友.系统测试性设计分析与验证[M].北京:北京航空航天大学 出版社,2003 Tian Zhong, Shi Junyou. System testability design analysis and demonstration . Beijing:Beijing University of Aeronautics and Astronautics Press, 2003(in Chinese) [4] Pecht, Dube M, Natishan M, et al. Evaluation of built-in test[J]. Aerospace and Electronic Systems, IEEE Transactions on , 2001, 37(1):266~271 [5] Karen T, David G, Orwig. F/A-18E/F Built-in-test (BIT) maturation process . In:National Defense Industrial Association System Engineering Committee 3rd Annual Systems Engineering & Supportability Conference , 2000. 401~408 [6] Nick Barnett. In-service reliability, maintainability and testability demonstrations-15 years of experience . In:Proceedings Annual Reliability and Maintainability Symposium . Tampa Florida:The International Symposium Product Quality & Integrity, 2003. 587~592 -
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