[1] |
Nelson W B.Accelerated testing:Statistical models,test plans,and data analysis[M].New York:John Wiley & Sons,2009:493-544.
|
[2] |
Meeker W Q,Escobar L A,Lu C J.Accelerated degradation tests:Modeling and analysis[J].Technometrics,1998,40(2):89-99.
|
[3] |
邓爱民,陈循,张春华,等.加速退化试验技术综述[J].兵工学报,2007,28(8):1002-1007. Deng A M,Chen X,Zhang C H,et al.A comprehensive review of accelerated degradation testing[J].Acta Armamentarii,2007,28(8):1002-1007(in Chinese).
|
[4] |
Wang Z,Huang H Z,Du L.Reliability analysis on competitive failure processes under fuzzy degradation data[J].Applied Soft Computing,2011,11(3):2964-2973.
|
[5] |
Gonzalez-Gonzalez D S,Alejo R J P,Cantu-Sifuentes M,et al.A non-linear fuzzy regression for estimating reliability in a degradation process[J].Applied Soft Computing,2014,16:137-147.
|
[6] |
Alefeld G,Mayer G.Interval analysis:Theory and applications[J].Journal of Computational and Applied Mathematics,2000,121(1-2):421-464.
|
[7] |
Tanaka H,Lee H.Interval regression analysis by quadratic programming approach[J].IEEE Transactions on Fuzzy Systems,1998,6(4):473-481.
|
[8] |
王军,邱志平,王晓军.应力强度因子的区间分析方法[J].航空学报,2008,29(3):611-615. Wang J,Qiu Z P,Wang X J.Interval analysis for stress intensity factors[J].Acta Aeronautica et Astronautica Sinica,2008,29(3):611-615(in Chinese).
|
[9] |
Yu I T,Chang C L.Applying Bayesian model averaging for quantile estimation in accelerated life tests[J].IEEE Transactions on Reliability,2012,61(1):74-83.
|
[10] |
Chateauneuf A.Accelerated life testing and degradation modeling[J].Reliability Engineering & System Safety,2014,131:228.
|
[11] |
Ye Z S,Xie M.Stochastic modelling and analysis of degradation for highly reliable products[J].Applied Stochastic Models in Business and Industry,2014,31(1):13-32.
|
[12] |
Park C,Padgett W J.Stochastic degradation models with several accelerating variables[J].IEEE Transactions on Reliability,2006,55(2):379-390.
|
[13] |
Pan Z Q,Balakrishnan N.Multiple-steps step-stress accelerated degradation modeling based on Wiener and Gamma processes[J].Communications in Statistics-Simulation and Computation,2010,39(7):1384-1402.
|
[14] |
Li X Y,Jiang T M,Sun F Q,et al.Constant stress ADT for superluminescent diode and parameter sensitivity analysis[J].Eksploatacja I Niezawodnosc-Maintenance and Reliability,2010(2):21-26.
|
[15] |
Wang X,Jiang P,Guo B,et al.Real-time reliability evaluation with a general Wiener process-based degradation model[J].Quality and Reliability Engineering International,2014,30(2):205-220.
|
[16] |
Escobar L A,Meeker W Q.A review of accelerated test models[J].Statistical Science,2006,21(4):552-577.
|
[17] |
Chhikara R S,Folks J L.The inverse Gaussian distribution:Theory,methodology,and applications[M].New York:CRC Press,1988:23-29.
|
[18] |
Meeker W Q,Escobar L A.Statistical methods for reliability data[M].New York:John Wiley & Sons,1998:631.
|