Volume 40 Issue 3
Mar.  2014
Turn off MathJax
Article Contents
Liu Hui, Jin Maozhong. Embedded software testing technology based on all-digital simulation[J]. Journal of Beijing University of Aeronautics and Astronautics, 2014, 40(3): 394-400. doi: 10.13700/j.bh.1001-5965.2013.0260(in Chinese)
Citation: Liu Hui, Jin Maozhong. Embedded software testing technology based on all-digital simulation[J]. Journal of Beijing University of Aeronautics and Astronautics, 2014, 40(3): 394-400. doi: 10.13700/j.bh.1001-5965.2013.0260(in Chinese)

Embedded software testing technology based on all-digital simulation

doi: 10.13700/j.bh.1001-5965.2013.0260
  • Received Date: 14 May 2013
  • Publish Date: 20 Mar 2014
  • For the test of real-time embedded system, the integrated all-digital simulation technology was proposed, which can resolve two functional problems in current software testing environment: ①Taking the simulation clock as the time reference, the synchronization due to setting break points was resolved; ② the "dynamic stub" approach was designed to drive the unit-testing for the embedded program that may not be complete, i.e. lack of supporting functions, like library. Furthermore, by significantly reducing judgments in each clock cycle using the lossless compression, the efficiency problem of the simulation platform was resolved, which promotes the practicability of this technology. The integrated simulation technology supports the whole test process from unit test to the integrated test, which strengthens ability of finding software bugs in real-time signal exception processing, improves the efficiency of system-level software testing, and achieves the reuse of test scripts. The platform has been applied to the testing of flight control software.

     

  • loading
  • [1]
    Madni A M,Jackson S.Towards a conceptual framework for resilience engineering[J].Systems Journal,2009,3(2):181-191
    [2]
    DO-178B Software considerations in airborne systems and equipment certification[S]
    [3]
    Yue J,Harman M.An analysis and survey of the development of mutation testing[J].IEEE Transactions on Software Engineering,2011,37(5):649-678
    [4]
    Becker M,Kuznik C,Joy M M,et al.Binary mutation testing through dynamic translation[C]//Robert Swarz.Proceedings of the International Canference on Dependable Systems and Networks (DSN).Washington DC:IEEE Computer Society,2012: 1-12
    [5]
    Chiang M C,Yeh T C,Tseng G F.A QEMU and system C-based cycle-accurate ISS for performance estimation on SoC development[J].IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems,2011,30(4):593-606
    [6]
    Vermeulen B.Functional debug techniques for embedded systems[J].IEEE Design Test of Computers,2008,25(3):208-215
    [7]
    Jonathan B R.How debuggers work:algorithms,data structures,and architecture[M].New York:John Wiley & Sons Inc,1996
    [8]
    Eilam E.Reversing:secrets of reverse engineering[M].New York:John Wiley & Sons Inc,2005
    [9]
    Mackinnon T,Freeman S,Craig P.Endo-testing: unit testing with mock objects[M]//Succi G,Marchesi M.Extreme Programming Examined.Boston,MA:Addison-Wesley Longman Publishing Co,2001:287-301
    [10]
    Ebert C,Jones C.Embedded software:facts,figures,and future[J].Computer,2009,42(4):42-52
    [11]
    Gschwind M,Kemal E,Erik A,et al.Binary translation and architecture convergence issues for IBM system/390[C]//John Reynders.Proceedings of the 14th International Conference on Supercomputing.Santa Fe:ACM,2000:336-347
  • 加载中

Catalog

    通讯作者: 陈斌, bchen63@163.com
    • 1. 

      沈阳化工大学材料科学与工程学院 沈阳 110142

    1. 本站搜索
    2. 百度学术搜索
    3. 万方数据库搜索
    4. CNKI搜索

    Article Metrics

    Article views(1083) PDF downloads(599) Cited by()
    Proportional views
    Related

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return