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Volume 40 Issue 8
Aug.  2014
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Journal of Beijing University of Aeronautics and Astronautics  > 2014  >  40(8): 1073-1077.
Jiang Yuguang, Han Jianwei, Zhu Xiang, et al. Single event upset mitigation testing of SRAM-based FPGAs[J]. Journal of Beijing University of Aeronautics and Astronautics, 2014, 40(8): 1073-1077. doi: 10.13700/j.bh.1001-5965.2013.0514(in Chinese)
Citation: Jiang Yuguang, Han Jianwei, Zhu Xiang, et al. Single event upset mitigation testing of SRAM-based FPGAs[J]. Journal of Beijing University of Aeronautics and Astronautics, 2014, 40(8): 1073-1077. doi: 10.13700/j.bh.1001-5965.2013.0514(in Chinese)
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Single event upset mitigation testing of SRAM-based FPGAs

doi: 10.13700/j.bh.1001-5965.2013.0514

  • Center for Space Science and Applied Research, Chinese Academy of Sciences, Beijing 100190, China

  • Received Date: 04 Sep 2013
  • Publish Date: 20 Aug 2014
    Abstract
  • Pulsed laser and heavy ions irradiation experiment was applied to study the effectiveness of the mitigation techniques of triple modular redundancy(TMR) and dynamic scrubbing for the Virtex-Ⅱ XC2V1000. When both dynamic scrubbing and TMR methods were used, the design of data encryption standard (DES) was observed to be essentially immune to functional errors. The cross section for functional errors utilizing different mitigation techniques was obtained, and the functional error was sensitive to configuration memory upsets. According to error rates of a Virtex-Ⅱ XC2V1000 in polar orbit for configuration memory, dynamic scrubbing in combination with TMR can repair the design to maintain state information, and the only effective mitigation method for an SRAM-based field programmable gate array (FPGA) design intended for space flight is to incorporate both TMR and scrubbing. The result shows that pulsed laser can be used to evaluate the mitigation techniques of TMR and dynamic scrubbing.

     

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