Volume 42 Issue 3
Mar.  2016
Turn off MathJax
Article Contents
CAI Zhongyi, CHEN Yunxiang, ZHANG Zhengmin, et al. Reliability assessment method of nonlinear step-stress accelerated degradation data[J]. Journal of Beijing University of Aeronautics and Astronautics, 2016, 42(3): 576-582. doi: 10.13700/j.bh.1001-5965.2015.0459(in Chinese)
Citation: CAI Zhongyi, CHEN Yunxiang, ZHANG Zhengmin, et al. Reliability assessment method of nonlinear step-stress accelerated degradation data[J]. Journal of Beijing University of Aeronautics and Astronautics, 2016, 42(3): 576-582. doi: 10.13700/j.bh.1001-5965.2015.0459(in Chinese)

Reliability assessment method of nonlinear step-stress accelerated degradation data

doi: 10.13700/j.bh.1001-5965.2015.0459
Funds:  Defense Advanced Research Project
  • Received Date: 08 Jul 2015
  • Publish Date: 20 Mar 2016
  • Aiming at nonlinear degradation data in the occasion of step-stress accelerated degradation test (SSADT), a reliability assessment method for degradation data based on Wiener process is put forward in consideration of individual performance degradation variation. Firstly, the process and performance degradation data model of SSADT are analyzed. Secondly, the nonlinear Wiener process is used to describe the nonlinear degradation process of products. The time scale model is used to change nonlinear data into linear data, and the drift coefficient of Wiener process is regarded as a random variable. A lifetime model of nonlinear degradation data is built in consideration of individual variation. According to the collected SSADT data, the two-step maximum likelihood estimation method is used to determine the unknown parameters in the lifetime model. Finally, an example of laser degradation data is analyzed to show that the presented model is matching well and the assessment result is more accurate.

     

  • loading
  • [1]
    TANG S, GUO X,YU C,et al.Accelerated degradation tests modeling based on the nonlinear Wiener process with random effects[J].Mathematical Problems in Engineering,2014,201(4):1-11.
    [2]
    WANG X. Wiener processes with random effects for degradation data[J].Journal of Multivariate Analysis,2010,101(2):340-351.
    [3]
    贾占强,蔡金燕, 梁玉英,等.基于步进加速退化试验的电子产品可靠性评估技术[J].系统工程理论与实践,2010,30(7):1279-1285. JIA Z Q,CAI J Y,LIANG Y Y,et al.Reliability assessment technology for electronic equipment based on step-up-stress accelerated degradation testing[J].Systems Engineering-The-ory & Practice,2010,30(7):1279-1285(in Chinese).
    [4]
    XIA X T. Forecasting method for product reliability along with performance data[J].Journal of Failure Analysis and Prevention,2012,12(5):532-540.
    [5]
    TSAI C C, TSENG S T,BALAKRISHNAN N.Mis-specification analyses of gamma and Wiener degradation processes[J].Journal of Statistical Planning and Inference,2011,141(12):3725-3735.
    [6]
    潘正强,周经伦, 孙权.基于Wiener过程的步进应力加速退化建模[J].系统工程与电子技术,2011,33(4):963-968. PAN Z Q,ZHOU J L,SUN Q.Step-stress accelerated degradation modeling based on Wiener process[J].Systems Engineering and Electronics,2011,33(4):963-968(in Chinese).
    [7]
    TANG J, SU T S.Estimating failure time distribution and its parameters based on intermediate data from a Wiener degradation model[J].Naval Research Logistics,2008,55(3):265-276.
    [8]
    WHITMORE G A, SCHENKELBERG F.Modeling accelerated degradation data using Wiener diffusion with a time scale transformation[J].Lifetime Data Analysis,1997,3(1):27-45.
    [9]
    SI X S, WANG W B,HU C H,et al.Remaining useful life estimation based on a nonlinear diffusion degradation process[J].IEEE Transactions on Reliability,2012,61(1):50-67.
    [10]
    王小林,郭波, 程志君.基于非线性漂移Wiener过程的产品实时可靠性评估[J].中南大学学报(自然科学版),2013,44(8):3203-3209. WANG X L,GUO B,CHENG Z J.Real-time reliability evaluation for product with nonlinear drift-based Wiener process[J].Journal of Central South University(Science and Technology),2013,44(8):3203-3209(in Chinese).
    [11]
    王浩伟,徐廷学, 张鑫.基于步进加速退化试验的某型电连接器可靠性评估[J].电光与控制,2014,21(9):104-107. WANG H W,XU T X,ZHANG X.Reliability assessment for a certain type of electrical connector based on step-stress accelerated degradation test[J].Electronics Optics & Control,2014,21(9):104-107(in Chinese).
    [12]
    WANG X L, BALAKRISHNAN N,GUO B.Residual life estimation based on a generalized Wiener degradation process[J].Reliability Engineering & System Safety,2014,124:13-23.
    [13]
    王小林,郭波, 程志君.融合多源信息的维纳过程性能退化产品的可靠性评估[J].电子学报,2012,40(5):977-982. WANG X L,GUO B,CHENG Z J.Reliability assessment of products with Wiener process degradation by fusing multiple information[J].Acta Electronica Sinica,2012,40(5):977-982(in Chinese).
    [14]
    唐圣金,郭晓松, 周召发,等.步进应力加速退化试验的建模与剩余寿命估计[J].机械工程学报,2014,50(16):33-40. TANG S J,GUO X S,ZHOU Z F,et al.Step stress accelerated degradation process modeling and remaining useful life estimation[J].Journal of Mechanical Engineering,2014,50(16):33-40(in Chinese).
    [15]
    TANG S J, YU C Q,WANG X,et al.Remaining useful life prediction of Lithium-ion batteries based on the Wiener process with measurement error[J].Energies,2014,7(2):520-547.
    [16]
    姜同敏. 可靠性试验技术[M].北京:北京航空航天大学出版社,2012:202-204. JIANG T M.Reliability test technology[M].Beijing:Beihang University Press,2012:202-204(in Chinese).
    [17]
    MEEKER W Q, ESCOBAR L A.Statistical methods for reliability data[M].Hoboken:John Wiley & Sons,1998:56-63.
    [18]
    PENG C Y, TSENG S T.Mis-specification analysis of linear degradation models[J].IEEE Transactions on Reliability,2009,58(3):444-455.
    [19]
    孙权,周星,冯静,等. 寿命分布的参数Bootstrap拟合优度检验方法[J].国防科技大学学报,2014,36(3):112-116. SUN Q,ZHOU X,FENG J,et al.Goodness-of-fittest for life distributions based on parametric Bootstrap[J].Journal of National University of Defense Technology,2014,36(3):112-116(in Chinese).
  • 加载中

Catalog

    通讯作者: 陈斌, bchen63@163.com
    • 1. 

      沈阳化工大学材料科学与工程学院 沈阳 110142

    1. 本站搜索
    2. 百度学术搜索
    3. 万方数据库搜索
    4. CNKI搜索

    Article Metrics

    Article views(924) PDF downloads(639) Cited by()
    Proportional views
    Related

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return