Citation: | CAI Zhongyi, CHEN Yunxiang, ZHANG Zhengmin, et al. Reliability assessment method of nonlinear step-stress accelerated degradation data[J]. Journal of Beijing University of Aeronautics and Astronautics, 2016, 42(3): 576-582. doi: 10.13700/j.bh.1001-5965.2015.0459(in Chinese) |
[1] |
TANG S, GUO X,YU C,et al.Accelerated degradation tests modeling based on the nonlinear Wiener process with random effects[J].Mathematical Problems in Engineering,2014,201(4):1-11.
|
[2] |
WANG X. Wiener processes with random effects for degradation data[J].Journal of Multivariate Analysis,2010,101(2):340-351.
|
[3] |
贾占强,蔡金燕, 梁玉英,等.基于步进加速退化试验的电子产品可靠性评估技术[J].系统工程理论与实践,2010,30(7):1279-1285. JIA Z Q,CAI J Y,LIANG Y Y,et al.Reliability assessment technology for electronic equipment based on step-up-stress accelerated degradation testing[J].Systems Engineering-The-ory & Practice,2010,30(7):1279-1285(in Chinese).
|
[4] |
XIA X T. Forecasting method for product reliability along with performance data[J].Journal of Failure Analysis and Prevention,2012,12(5):532-540.
|
[5] |
TSAI C C, TSENG S T,BALAKRISHNAN N.Mis-specification analyses of gamma and Wiener degradation processes[J].Journal of Statistical Planning and Inference,2011,141(12):3725-3735.
|
[6] |
潘正强,周经伦, 孙权.基于Wiener过程的步进应力加速退化建模[J].系统工程与电子技术,2011,33(4):963-968. PAN Z Q,ZHOU J L,SUN Q.Step-stress accelerated degradation modeling based on Wiener process[J].Systems Engineering and Electronics,2011,33(4):963-968(in Chinese).
|
[7] |
TANG J, SU T S.Estimating failure time distribution and its parameters based on intermediate data from a Wiener degradation model[J].Naval Research Logistics,2008,55(3):265-276.
|
[8] |
WHITMORE G A, SCHENKELBERG F.Modeling accelerated degradation data using Wiener diffusion with a time scale transformation[J].Lifetime Data Analysis,1997,3(1):27-45.
|
[9] |
SI X S, WANG W B,HU C H,et al.Remaining useful life estimation based on a nonlinear diffusion degradation process[J].IEEE Transactions on Reliability,2012,61(1):50-67.
|
[10] |
王小林,郭波, 程志君.基于非线性漂移Wiener过程的产品实时可靠性评估[J].中南大学学报(自然科学版),2013,44(8):3203-3209. WANG X L,GUO B,CHENG Z J.Real-time reliability evaluation for product with nonlinear drift-based Wiener process[J].Journal of Central South University(Science and Technology),2013,44(8):3203-3209(in Chinese).
|
[11] |
王浩伟,徐廷学, 张鑫.基于步进加速退化试验的某型电连接器可靠性评估[J].电光与控制,2014,21(9):104-107. WANG H W,XU T X,ZHANG X.Reliability assessment for a certain type of electrical connector based on step-stress accelerated degradation test[J].Electronics Optics & Control,2014,21(9):104-107(in Chinese).
|
[12] |
WANG X L, BALAKRISHNAN N,GUO B.Residual life estimation based on a generalized Wiener degradation process[J].Reliability Engineering & System Safety,2014,124:13-23.
|
[13] |
王小林,郭波, 程志君.融合多源信息的维纳过程性能退化产品的可靠性评估[J].电子学报,2012,40(5):977-982. WANG X L,GUO B,CHENG Z J.Reliability assessment of products with Wiener process degradation by fusing multiple information[J].Acta Electronica Sinica,2012,40(5):977-982(in Chinese).
|
[14] |
唐圣金,郭晓松, 周召发,等.步进应力加速退化试验的建模与剩余寿命估计[J].机械工程学报,2014,50(16):33-40. TANG S J,GUO X S,ZHOU Z F,et al.Step stress accelerated degradation process modeling and remaining useful life estimation[J].Journal of Mechanical Engineering,2014,50(16):33-40(in Chinese).
|
[15] |
TANG S J, YU C Q,WANG X,et al.Remaining useful life prediction of Lithium-ion batteries based on the Wiener process with measurement error[J].Energies,2014,7(2):520-547.
|
[16] |
姜同敏. 可靠性试验技术[M].北京:北京航空航天大学出版社,2012:202-204. JIANG T M.Reliability test technology[M].Beijing:Beihang University Press,2012:202-204(in Chinese).
|
[17] |
MEEKER W Q, ESCOBAR L A.Statistical methods for reliability data[M].Hoboken:John Wiley & Sons,1998:56-63.
|
[18] |
PENG C Y, TSENG S T.Mis-specification analysis of linear degradation models[J].IEEE Transactions on Reliability,2009,58(3):444-455.
|
[19] |
孙权,周星,冯静,等. 寿命分布的参数Bootstrap拟合优度检验方法[J].国防科技大学学报,2014,36(3):112-116. SUN Q,ZHOU X,FENG J,et al.Goodness-of-fittest for life distributions based on parametric Bootstrap[J].Journal of National University of Defense Technology,2014,36(3):112-116(in Chinese).
|