Citation: | WANG Haowei, TENG Kenan, XI Wenjunet al. Accelerated degradation modeling method based on Inverse Gaussian processes with random parameters[J]. Journal of Beijing University of Aeronautics and Astronautics, 2016, 42(9): 1843-1850. doi: 10.13700/j.bh.1001-5965.2015.0542(in Chinese) |
[1] |
WANG X.Wiener processes with random effects for degradation data[J].Journal of Multivariate Analysis,2010,101(2):340-351.
|
[2] |
SI X S,WANG W B,HU C H,et al.A Wiener-process-based degradation model with a recursive filter algorithm for remaining useful life estimation[J].Mechanical Systems and Signal Processing,2013,35(1-2):219-237.
|
[3] |
刘君强,谢吉伟,左洪福,等.基于随机Wiener过程的航空发动机剩余寿命预测[J].航空学报,2015,36(2):564-574.LIU J Q,XIE Z W,ZUO H F,et al.Residual lifetime prediction for aeroengines based on Wiener process with random effects[J].Acta Aeronautica et Astronautica Sinica,2015,36(2):564-574(in Chinese).
|
[4] |
LAWLESS J,CROWDER M.Covariates and random effects in a Gamma process model with application to degradation and failure[J].Lifetime Data Analysis, 2004,10(3):213-227.
|
[5] |
WANG H W,XU T X,MI Q L.Lifetime prediction based on Gamma processes from accelerated degradation data[J].Chinese Journal of Aeronautics,2015,28(1):172-179.
|
[6] |
TSAI C C,TSENG S T,BALAKRISHNAN N.Optimal design for degradation tests based on Gamma processes with random effects[J].IEEE Transactions on Reliability,2012,61(2):604-613.
|
[7] |
WANG X,XU D.An inverse Gaussian process model for degradation data[J].Technometrics,2010,52(2):188-197.
|
[8] |
PENG W W,LI Y F,YANG Y J,et al.Inverse Gaussian process models for degradation analysis:A Bayesian perspective[J].Reliability Engineering and System Safety,2014,130:175-189.
|
[9] |
YE Z S,CHEN N.The inverse Gaussian process as degradation model[J].Technometrics,2014,56(3):302-311.
|
[10] |
PENG C Y.Inverse Gaussian processes with random effects and explanatory variables for degradation data[J].Technometrics,2015,57(1):100-111.
|
[11] |
PARK C,PADGETT W J.Accelerated degradation models for failure based on geometric Brownian motion and Gamma processes[J].Lifetime Data Analysis,2005,11(4):511-527.
|
[12] |
YE Z S,CHEN L P,TANG L C,et al.Accelerated degradation test planning using the Inverse Gaussian process[J].IEEE Transactions on Reliability,2014,63(3):750-763.
|
[13] |
王浩伟,徐廷学,赵建忠.融合加速退化和现场实测退化数据的剩余寿命预测方法[J].航空学报,2014,35(12):3350-3357.WANG H W,XU T X,ZHAO J Z.Residual life prediction method fusing accelerated degradation and field degradation data[J].Acta Aeronautica et Astronautica Sinica,2014,35(12):3350-3357(in Chinese).
|
[14] |
LING M H,TSUI K L,BALAKRISHNAN N.Accelerated degradation analysis for the quality of a system based on the Gamma process[J].IEEE Transactions on Reliability,2015,64(1):463-472.
|
[15] |
周源泉,翁朝曦,叶喜涛.论加速系数与失效机理不变的条件(Ⅰ)-寿命型随机变量的情况[J].系统工程与电子技术,1996,18(1):55-67.ZHOU Y Q,WENG Z X,YE X T.Study on accelerated factor and condition for constant failure mechanism (Ⅰ)-The case for lifetime is a random variable[J].System Engineering and Electronics,1996,18(1):55-67(in Chinese).
|
[16] |
王浩伟,徐廷学,王伟亚.基于退化模型的失效机理一致性检验方法[J].航空学报,2015,36(3):889-897.WANG H W,XU T X,WANG W Y.Test method of failure mechanism consistency based on degradation model[J].Acta Aeronautica et Astronautica Sinica,2015,36(3):889-897(in Chinese).
|
[17] |
BALAKRISHNAN N,LING M H.EM algorithm for one-shot device testing under the exponential distribution[J].Computational Statistics & Data Analysis,2012,56(3):502-509.
|
[18] |
韩立岩,蔡明生,尹力博.正态逼近与基于覆盖宽度的EM估计[J].北京航空航天大学学报,2013,39(5):654-659.HAN L Y,CAI M S,YIN L B.Approximation by normal distribution with covering width based on EM estimation[J].Journal of Beijing University of Aeronautics and Astronautics,2013,39(5):654-659(in Chinese).
|
[19] |
徐廷学,王浩伟,张鑫.EM算法在Wiener过程随机参数的超参数值估计中的应用[J].系统工程与电子技术,2015,37(3):707-712.XU T X,WANG H W,ZHANG X.Application of EM algorithm to estimate hyper parameters of the random parameters of Wiener processes[J].Journal of Systems Engineering and Electronics,2015,37(3):707-712(in Chinese).
|
[20] |
MEEKER W Q,ESCOBAR A.Statistical methods for reliability data[M].New York:John Wiley & Sons,1998:630-640.
|
[21] |
EFRON B.Better bootstrap confidence intervals[J].Journal of American Statistical Association,1987,82(397):171-185.
|
[22] |
MARKS C E,GLEN A G,ROBINSON M W,et al.Applying bootstrap methods to system reliability[J].The American Statistician,2014,68(3):174-180.
|