Volume 42 Issue 12
Dec.  2017
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Article Contents
WANG Zhaobin, FU Sai, SHANG Shang, et al. Storage degradation testing and life prediction for missile electromagnetic relay[J]. Journal of Beijing University of Aeronautics and Astronautics, 2016, 42(12): 2610-2619. doi: 10.13700/j.bh.1001-5965.2015.0789(in Chinese)
Citation: WANG Zhaobin, FU Sai, SHANG Shang, et al. Storage degradation testing and life prediction for missile electromagnetic relay[J]. Journal of Beijing University of Aeronautics and Astronautics, 2016, 42(12): 2610-2619. doi: 10.13700/j.bh.1001-5965.2015.0789(in Chinese)

Storage degradation testing and life prediction for missile electromagnetic relay

doi: 10.13700/j.bh.1001-5965.2015.0789
Funds:

National Natural Science Foundation of China 51507074

Natural Science Foundation of the Higher Education Institutions of Jiangsu Province, China 15KJB470003

China Postdoctoral Science Foundation 2015M571898

Open Foundation of Zhejiang Provincial Top Key Academic Discipline of Mechanical Engineering and Zhejiang Sci-Tech University Key Laboratory ZSTUME01A02

More Information
  • Corresponding author: WANG Zhaobin, Tel.:0511-84401153, E-mail:wangzb@just.edu.cn
  • Received Date: 01 Dec 2015
  • Accepted Date: 28 Jan 2016
  • Publish Date: 20 Dec 2017
  • Missile electromagnetic relay (EMR) is one of the key electromechanical components used for signal transmission, load switching and circuit protection in defense weapon system. How to reliably evaluate the storage reliability of missile EMR has become the most important problem that is urgent to be solved. This study used missile EMR as research object. A new method for testing storage reliability is proposed by performance parameters degradation. The test and analysis system of missile EMR storage parameters was designed and developed. Based on the analysis of parameters changing in storage degradation testing, the modeling storage reliability method of missile EMR is extensively investigated. Prediction parameters preprocessing method is proposed which is based on time series analysis with wavelet transform method. And in this way, the prediction accuracy is increased. Parameters of the storage degradation model are estimated through the regression theory, and the storage life of missile EMR under normal stress is predicted.

     

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  • [1]
    郭凤仪, 陈中华.电接触理论及其应用技术[M].北京:中国电力出版社, 2008:1-18.

    GUO F Y, CHEN Z H.Electrical contacts theory applications and technology[M].Beijing:China Electric Power Press, 2008:1-18(in Chinese).
    [2]
    尚爱聪.军用密封继电器非工作状态贮存可靠性研究[C]//第八届全国可靠性物理学术讨论会论文集.北京:中国电子学会, 1999:263-270.

    SHANG A C.Military sealed relays non-work storage reliability research[C]//Proceedings of the 8th National Reliability Physical Seminar.Beijing:Chinese Institute of Electronics Press, 1999:263-270(in Chinese).
    [3]
    陆俭国, 骆燕燕, 李文华, 等.航天继电器贮存寿命试验及失效分析[J].电工技术学报, 2009, 24(2):54-59. http://www.cnki.com.cn/Article/CJFDTOTAL-DGJS200902011.htm

    LU J G, LUO Y Y, LI W H, et al.Storage life test and failure analysis of aerospace relays[J].Transactions of China Electrotechnical Society, 2009, 24(2):54-59(in Chinese). http://www.cnki.com.cn/Article/CJFDTOTAL-DGJS200902011.htm
    [4]
    CHEN Z H, ZHENG S R.Lifetime distribution based degradation analysis[J].IEEE Transactions on Reliability, 2005, 54(1):3-10. doi: 10.1109/TR.2004.837519
    [5]
    NEUHAUS A R, RIEDER W F, HAMMERSCHMIDT M.Influence of electrical and mechanical parameters on contact welding in low power switches[J].IEEE Transactions on Components and Packaging Technologies, 2004, 27(1):4-11. doi: 10.1109/TCAPT.2004.825777
    [6]
    CHEN Z K, WITTER G.Dynamic welding of silver contacts under different mechanical bounce conditions[C]//Proceedings of the 45th IEEE Holm Conference on Electrical Contacts. Piscataway, NJ:IEEE Press, 1999:1-8.
    [7]
    MCRBRIDE J W, SHARKH S M.Electrical contact phenomena during impact[J].IEEE Transactions on Components Hybrids, Manufacture Technologies, 1992, 15(1):184-192. https://www.researchgate.net/publication/3190395_Electrical_Contact_Phenomena_During_Impact
    [8]
    RIEDER W F, NEUHAUS A R.Short arc modes determining both contact welding and material transfer[J].IEEE Transactions on Components and Packaging Technologies, 2007, 30(1):9-14. doi: 10.1109/TCAPT.2007.892056
    [9]
    CHEN Z K, WITTER G.Comparison in performance for silver-tin-indium oxide materials made by internal oxidation and power metallurgy[C]//Proceedings of the 55th IEEE Holm Conference on Electrical Contacts.Piscataway, NJ:IEEE Press, 2009:180-186.
    [10]
    TAMAI T.Effect of humidity on growth of oxide film on surface of copper contacts[J].IEICE Transactions on Electron, 2007, E90-C (7):1391-1397. doi: 10.1093/ietele/e90-c.7.1391
    [11]
    READ M B, LANG J H, SLOCUM A H.Contact resistance in flat thin films[C]//Proceedings of the 55th IEEE Holm Conference on Electrical Contacts.Piscataway, NJ:IEEE Press, 2009:300-306.
    [12]
    臧春艳, 何俊佳, 李劲, 等.密封继电器接触电阻与表面膜研究[J].中国电机工程学报, 2008, 28(31):125-130. http://www.cnki.com.cn/Article/CJFDTOTAL-ZGDC200831020.htm

    ZANG C Y, HE J J, LI J, et al.Contact resistance and surface film of saealed relay contacts[J].Proceedings of the CSEE, 2008, 28(31):125-130(in Chinese). http://www.cnki.com.cn/Article/CJFDTOTAL-ZGDC200831020.htm
    [13]
    郭凤仪, 王国强, 董讷.银基触头材料电弧侵蚀特性及裂纹形成机理分析[J].中国电机工程学报, 2004, 24(9):209-217. http://www.cnki.com.cn/Article/CJFDTOTAL-ZGDC200409037.htm

    GUO F Y, WANG G Q, DONG N.The arc erosion characteristics and crack formation mechanisms analysis of silver-based contact materials[J].Proceedings of the CSEE, 2004, 24(9):209-217(in Chinese). http://www.cnki.com.cn/Article/CJFDTOTAL-ZGDC200409037.htm
    [14]
    陈鹏, 陆俭国, 姚芳, 等.动态接触电阻测量及触点失效预测研究[J].电工电能新技术, 2005, 27(3):27-30. http://www.cnki.com.cn/Article/CJFDTOTAL-DGDN200503007.htm

    CHEN P, LU J G, YAO F, et al.Research on dynamic contact resistance measurement and failure prediction of relay contacts[J].Advanced Technology of Electrical Engineering and Energy, 2005, 27(3):27-30(in Chinese). http://www.cnki.com.cn/Article/CJFDTOTAL-DGDN200503007.htm
    [15]
    吴细秀, 李震彪.电器电极材料喷溅侵蚀的理论计算[J].中国电机工程学报, 2003, 23(6):96-101. http://www.cnki.com.cn/Article/CJFDTOTAL-ZGDC200306018.htm

    WU X X, LI Z B.Theoretic analysis on sputtering erosion of electrode[J].Proceedings of the CSEE, 2003, 23(6):96-101(in Chinese). http://www.cnki.com.cn/Article/CJFDTOTAL-ZGDC200306018.htm
    [16]
    TAKANO E, MANO K.The failure mode and lifetime of static contacts[J].IEEE Transactions on Component, Packaging, and Manufacturing, 1968, 4(2):51-55.
    [17]
    张增照.电子设备非工作状态可靠性预计手册:GJB/Z 108A-2006[S].北京:总装备部军标出版发行部, 2007:52-54.

    ZHANG Z Z.Nonoperating reliability prediction handbook for electronic equipment:GJB/Z 108A-2006[S].Beijing:Department of General Equipment Department of Military Standard Publishing, 2007:52-54(in Chinese).
    [18]
    WANG Z B, ZHAI G F, HUANG X Y, et al.Study on feasibility of storage accelerated testing based on parameter degradation for aerospace relays[C]//Proceedings of the 3rd Annual IEEE Conference on Prognostics and System Health Management.Piscataway, NJ:IEEE Press, 2012:1-5.
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