| Citation: | XU Dan, LIN Kunsong, Chen Yunxiaet al. Failure behavior based storage life test design for inertial navigation products[J]. Journal of Beijing University of Aeronautics and Astronautics, 2018, 44(3): 437-443. doi: 10.13700/j.bh.1001-5965.2017.0408(in Chinese)
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This paper proposed a failure-behavior-model based accelerated degradation test designing method for assessing the storage life of accelerometer for inertial navigation products, which determines test stress levels while lacking of the preliminary experimental data. On the basis of analyzing the product characteristics and main mechanisms, the storage life characteristic parameters and test stress types are determined. An accelerometer failure behavior model which takes the material dispersion into consideration is established to describe the time-varying law. Given the highest stress level, based on the given confidence level and failure behavior model, a simulation accelerated degradation test design method is proposed to determine the lowest and intermediate stress levels with the constraint that the upper bound of degradation under lower stress level is lower than the lower bound of degradation under high stress level. Following the proposed framework, the experimental profile is designed, and then a best test plan is finally obtained. The validity of the proposed method is verified by a case study.
| [1] |
YU H.Designing an accelerated degradation experiment by optimizing the estimation of the percentile[J]. Quality and Reliability Engineering International, 2003, 19(3):197-214. doi: 10.1002/(ISSN)1099-1638
|
| [2] |
YU H.Designing an accelerated degradation experiment with a reciprocal Weibull degradation rate[J]. Journal of Statistical Planning and Inference, 2006, 136(1):282-297. doi: 10.1016/j.jspi.2004.06.030
|
| [3] |
WEAVER B P, MEEKER W Q.Methods for planning repeated measures accelerated degradation tests[J]. Applied Stochastic Models in Business and Industry, 2014, 30(6):658-671. doi: 10.1002/asmb.2061
|
| [4] |
HU C, LEE M, TANG J.Optimum step-stress accelerated degradation test for Wiener degradation process under constraints[J]. European Journal of Operational Research, 2015, 241(2):412-421. doi: 10.1016/j.ejor.2014.09.003
|
| [5] |
WANG H, WANG G, DUAN F.Planning of step-stress accelerated degradation test based on the inverse Gaussian process[J]. Reliability Engineering & System Safety, 2016, 154:97-105. https://www.sciencedirect.com/science/article/pii/S0951832016300874
|
| [6] |
TSAI T, SUNG W, LIO Y L, et al.Optimal two-variable accelerated degradation test plan for Gamma degradation processes[J]. IEEE Transactions on Reliability, 2016, 65(1):459-468. doi: 10.1109/TR.2015.2435774
|
| [7] |
LING M H, TSUI K L, BALAKRISHNAN N.Accelerated degradation analysis for the quality of a system based on the Gamma process[J]. IEEE Transactions on Reliability, 2015, 64(1):463-472. doi: 10.1109/TR.2014.2337071
|
| [8] |
SHI Y, MEEKER W Q.Bayesian methods for accelerated destructive degradation test planning[J]. IEEE Transactions on Reliability, 2012, 61(1):245-253. doi: 10.1109/TR.2011.2170115
|
| [9] |
SHI Y, MEEKER W Q.Accelerated destructive degradation test planning[J]. Technometrics, 2009, 51(1):1-13. doi: 10.1198/TECH.2009.0001
|
| [10] |
LI Q, KECECIOGLU D B.Design of an optimal plan for an accelerated degradation test:A case study[J]. International Journal of Quality & Reliability Management, 2013, 23(4):426-440. http://cn.bing.com/academic/profile?id=a42216da05a94ac74bc812e7058a6a07&encoded=0&v=paper_preview&mkt=zh-cn
|
| [11] |
NASIR E A, PAN R.Simulation-based Bayesian optimal ALT designs for model discrimination[J]. Reliability Engineering & System Safety, 2015, 134(2):1-9. https://asu.pure.elsevier.com/en/publications/simulation-based-bayesian-optimal-alt-designs-for-model-discrimin
|
| [12] |
WANG Y, ZHANG C, ZHANG S, et al.Optimal design of constant stress accelerated degradation test plan with multiple stresses and multiple degradation measures[J]. Journal of Risk and Reliability, 2015, 229(1):83-93. doi: 10.1177/1748006X14552312
|
| [13] |
ZENG Z G, KANG R, WEN M, et al. Measuring reliability during product development considering aleatory and epistemic uncertainty[C]//Proceedings of the Annual Reliability and Maintainability Symposium. Piscataway, NJ: IEEE Press, 2015: 1-6.
|
| [14] |
XU D, CHEN Y X, KANG R.Quartz flexible accelerometer stability duration prediction on storage condition based on accelerated degradation test[J]. Chemical Engineering Transactions, 2013, 33(1):541-546. https://www.researchgate.net/publication/278058772_Quartz_Flexible_Accelerometer_Stability_Duration_Prediction_on_Storage_Condition_Based_on_Accelerated_Degradation_Test
|
| [15] |
许丹, 廖寻, 陈云霞, 等.加速度计贮存稳定期分析[J].北京航空航天大学学报, 2013, 39(2):173-177. http://bhxb.buaa.edu.cn/CN/abstract/abstract12525.shtml
XU D, LIAO X, CHEN Y X, et al.Analysis of the storage stability of accelerometers[J]. Journal of Beijing University of Aeronautics and Astronautics, 2013, 39(2):173-177(in Chinese). http://bhxb.buaa.edu.cn/CN/abstract/abstract12525.shtml
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