| Citation: | WU Yang, WANG Yi, YU Xinyu, et al. Algorithm of in-orbit SRAM for self-inspection[J]. Journal of Beijing University of Aeronautics and Astronautics, 2021, 47(6): 1233-1240. doi: 10.13700/j.bh.1001-5965.2020.0140(in Chinese)
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In-orbit self-inspection of Static Random Access Memory (SRAM) in spaceborne electronic equipment is used in the power-on initialization process. It is able to find the faulty unit of the memory before equipment starts to work. It provides a basis for evaluating the health status of electronic equipment. The structure and main failure principle of SRAM were analyzed, and the research in the special background of in-orbit application was conducted. Then, an improved test algorithm for the typical one was proposed. After the analysis and evaluation of the improved algorithm, the implementation of the algorithm on a 8 K×8 bit SRAM was carried out. Experimental results show that the improved algorithm is feasible. Compared with typical test algorithm, the improved algorithm has the advantages of low resource consumption and high fault coverage.
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