Degradation prediction of switching power supply based on EMD-LSTM

ZHANG Runzhi; CAI Yilun; WANG Xingjian; HE Wenbo; XU Jia; JIA Rujun

doi:10.13700/j.bh.1001-5965.2025.0872

Article Contents

Journal of Beijing University of Aeronautics and Astronautics > 2026 > Accepted Manuscript

ZHANG Runzhi, CAI Yilun, WANG Xingjian, et al. Degradation prediction of switching power supply based on EMD-LSTM[J]. Journal of Beijing University of Aeronautics and Astronautics. doi: 10.13700/j.bh.1001-5965.2025.0872(in Chinese)

Citation:

ZHANG Runzhi, CAI Yilun, WANG Xingjian, et al. Degradation prediction of switching power supply based on EMD-LSTM[J]. Journal of Beijing University of Aeronautics and Astronautics. doi: 10.13700/j.bh.1001-5965.2025.0872(in Chinese)