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Volume 37 Issue 10
Oct.  2011
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Journal of Beijing University of Aeronautics and Astronautics  > 2011  >  37(10): 1293-1297.
Fan Qiaoyun, Zhang Guangjun, Wei Xinguoet al. Sun sensor calibration based on exact modeling with intrinsic and extrinsic parameters[J]. Journal of Beijing University of Aeronautics and Astronautics, 2011, 37(10): 1293-1297. doi: CNKI:11-2625/V.20111013.1435.003(in Chinese)
Citation: Fan Qiaoyun, Zhang Guangjun, Wei Xinguoet al. Sun sensor calibration based on exact modeling with intrinsic and extrinsic parameters[J]. Journal of Beijing University of Aeronautics and Astronautics, 2011, 37(10): 1293-1297. doi: CNKI:11-2625/V.20111013.1435.003(in Chinese)
shu

Sun sensor calibration based on exact modeling with intrinsic and extrinsic parameters

doi: CNKI:11-2625/V.20111013.1435.003

  • School of Instrument Science and Opto-electronics Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100191, China

  • Received Date: 24 Jun 2010
  • Publish Date: 30 Oct 2011
    Abstract
  • Polynomial equation fitting and simply modeling with only intrinsic parameters were generally used methods to calibrate a sun sensor, in which its accuracy was limited to 0.02° in field of view: ±60°. To improve the accuracy, a new calibration method based on integrated modeling with intrinsic and extrinsic parameters was put forward. An integrated imaging model was firstly established with intrinsic and extrinsic parameters. And then the calibration points- data were acquired by using a 2-axis rotary table and a sun simulator. Finally, a two-step procedure was presented to optimize these parameters. This method does not require initial alignment between incident light and the imaging plane, and the calibration accuracy of intrinsic parameters were immune to extrinsic parameters error by exactly separating of them. Furthermore, the calibration accuracy is greatly improved by two-step optimization. Experimental results show that the calibration accuracy reaches 0.005°(field of view: ±60°) which is 4 times of the accuracy reached by generally used methods.

     

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