Simulation about the Conditioning Circuit of Sensor

LI Nan; Lü Jun-fang; LI Yu-tao; YUAN Mei

Volume 27 Issue 3

Mar. 2001

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Article Contents

Journal of Beijing University of Aeronautics and Astronautics > 2001 > 27(3): 280-283.

LI Nan, Lü Jun-fang, LI Yu-tao, et al. Simulation about the Conditioning Circuit of Sensor[J]. Journal of Beijing University of Aeronautics and Astronautics, 2001, 27(3): 280-283. (in Chinese)

Citation:

LI Nan, Lü Jun-fang, LI Yu-tao, et al. Simulation about the Conditioning Circuit of Sensor[J]. Journal of Beijing University of Aeronautics and Astronautics, 2001, 27(3): 280-283. (in Chinese)

LI Nan, Lü Jun-fang, LI Yu-tao, et al. Simulation about the Conditioning Circuit of Sensor[J]. Journal of Beijing University of Aeronautics and Astronautics, 2001, 27(3): 280-283. (in Chinese)

Citation:

LI Nan, Lü Jun-fang, LI Yu-tao, et al. Simulation about the Conditioning Circuit of Sensor[J]. Journal of Beijing University of Aeronautics and Astronautics, 2001, 27(3): 280-283. (in Chinese)

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Simulation about the Conditioning Circuit of Sensor

Beijing University of Aeronautics and Astronautics, Dept. of Automatic Control

Received Date: 25 Jan 2000
Publish Date: 31 Mar 2001

Abstract

Abstract

In testing system, measuring small signals is necessary. The conditioning circuit is a crucial section, and its reliability has a great influence on the whole testing system. By using the method of computer simulation and thermal analysis, the functions of the circuit can be simulated and relevant parameters can be optimized previously to promote the circuit-s capability. By this means, the research time can be dramatically shortened and the expense can be more less. Therefore, these methods have a great value in practice.
- circuit design,
- computer-aided analysis,
- simulation,
- thermal analysis