Volume 36 Issue 10
Oct.  2010
Turn off MathJax
Article Contents
Wan Kai, Ma Qishuang. Analysis of depth testing model for thin board specimen in pulsed thermography[J]. Journal of Beijing University of Aeronautics and Astronautics, 2010, 36(10): 1256-1260. (in Chinese)
Citation: Wan Kai, Ma Qishuang. Analysis of depth testing model for thin board specimen in pulsed thermography[J]. Journal of Beijing University of Aeronautics and Astronautics, 2010, 36(10): 1256-1260. (in Chinese)

Analysis of depth testing model for thin board specimen in pulsed thermography

  • Received Date: 15 Sep 2009
  • Publish Date: 31 Oct 2010
  • Pulsed thermography (PT) is always considered as a quantitative testing approach in infrared thermal imaging. One of its main models called temperature-contrast function (TCF) method is usually found invalidated in defect depth measurement when meets a thin sample. To exhibit the existing fault during TCF modeling, one-dimensional finite analytical solutions were used to carry out calculations instead of the approximate solution adopted in original TCF model under an ideal impulse excitation. Two kernel parameters, named as peak temperature-contrast time (PCT) and peak temperature-contrast slope time (PST), were detailedly analyzed both in temperature-contrast curve and its derivative line. Comparison was made in their detecting abilities. The results show that PCT is governed by background-s depth, not by test point-s depth, so this parameter isn-t suitable for a quantitative test; and PST is also manifested to have service restriction in a depth ratio between the two points (test point/reference point). The upper limit of this depth ratio (approximately 0.5) was obtained by a criterion equation as a theoretical reference when PST was chosen in applications.

     

  • loading
  • [1] Avdelidis N P,Almond D P,Dobbinson A,et al.Aircraft composites assessment by means of transient thermal NDT[J].Progress in Aerospace Sciences,2004,40:143-162 [2] Wallbrink C,Wade S A,Jones R.The effect of size on the quantitative estimation of defect depth in steel structures using lock-in thermography[J].J Appl Phys,2007,101(10):104907 [3] Han Xiaoyan.Measuring subsurface defect depth and metal loss by thermal wave imaging & inverse scattering of photon density waves .Detroit: Wayne State University,1997 [4] Ringermacher H I,Archacki R J,Veronesi W A.Nondestructive testing: transient depth thermography:United States,5711603 .1998-01-27 [5] Thomas R L,Favro L D,Kuo P K.Thermal wave imaging of hidden corrosion .ADA3436383,1998 [6] Maldague X,Galmiche F,Ziadi A.Advances in pulsed phase thermography[J].Infrared Physics & Technology,2002,43:175-181 [7] Shepard S M,Lhota J R,Rubadeux B A,et al.Reconstruction and enhancement of active thermographic image sequences[J].Optical Engineering,2003,42(5):1337-1342 [8] Sun J G.Method for determining defect depth using thermal imaging:United States,US6542849B2 .2003-04-01 [9] Sun J G.Analysis of pulsed thermography methods for defect depth prediction[J].Journal of Heat Transfer,2006,128(4):329-338
  • 加载中

Catalog

    通讯作者: 陈斌, bchen63@163.com
    • 1. 

      沈阳化工大学材料科学与工程学院 沈阳 110142

    1. 本站搜索
    2. 百度学术搜索
    3. 万方数据库搜索
    4. CNKI搜索

    Article Metrics

    Article views(2709) PDF downloads(238) Cited by()
    Proportional views
    Related

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return