Jiang Libiao, Liu Yonghua, Gu Fangde, et al. Design and parametric analysis of front suspension of new sport car[J]. Journal of Beijing University of Aeronautics and Astronautics, 2010, 36(4): 482-485. (in Chinese)
Citation: Zhao Lei, Wang Zulin, Zhou Lina, et al. Fast reliability evaluation for SRAM-based spaceborne FPGAs[J]. Journal of Beijing University of Aeronautics and Astronautics, 2013, 39(7): 863-868. (in Chinese)

Fast reliability evaluation for SRAM-based spaceborne FPGAs

  • Received Date: 05 Nov 2012
  • Publish Date: 30 Jul 2013
  • Static random access memory(SRAM)-based field programmable gate arrays (FPGAs) reliability is seriously affected by space radiation. A new method for fast reliability evaluation of SRAM-based FPGAs was proposed. Based on traditional fault injection technique, a pre-evaluation was introduced to analyze the effect of single event upsets (SEU) in logic gate-level and SEU sensitive bits in triple modular redundancy (TMR). Then, the fault sequences of different sensitive level were formed. Finally, different fault sequences were selected depending on the application needs and injected into system for evaluating reliability. The method can not only reduce the experiment times and improve the experiment efficiency but also ensure the fault coverage.

     

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