Citation: | Cui Jingwei, Xie Liyang. Auto-correlated charts based on dynamic Bayesian model[J]. Journal of Beijing University of Aeronautics and Astronautics, 2007, 33(03): 375-378. (in Chinese) |
[1] Montgomery D C. Introduction to statistical quality control[M]. 3rd ed. New York:John Wiley & Sons,1996 [2] Awin R W, Lee S J. The effects of autocorrelation and outliers on two-sided tolerance limits[J]. Technometrics,1998,40:24-38 [3] Atienza O O, Tang L C, Ang B W. A SPC procedure for detecting level shifts of autorrelated process[J]. Journal of Quality Technology,1998,30:340-351 [4] Dyer J N, Adams B M, Conerly M D. The reverse moving average control chart for monitoring auto-correlated process[J]. Journal of Quality Technology,2003,35:139-152 [5] Wang F K. A simple data transformation of auto-correlated data for SPC[J]. International Journal of Production Research,2005, 43(3):981-989 [6] Vasilopoulos A V, Stamboulis A P. Modification of control chart limits in the resence of data correlation[J]. Journal of Quality Technology,1978,10(1):20-30 [7] Wardell D G, Moskowitz H, Plantz R D. Run length distribution of special-cause control charts for correlated observations[J]. Technometrics,1994,36:3-17 [8] Jiang Wei, Tsui K L. A new SPC monitoring method:the ARMA chart [J]. Technometrics,2000,42(4):399-410 [9] 张孝令,刘福升,张承进,等. 贝叶斯动态模型及其预测[M]. 济南:山东科学技术出版社,1992 Zhang Xiaoling, Liu Fusheng, Zhang Chengjin, et al. Bayesian forecasting and dynamic models[M].Jinan:Shandong Science and Technology Press, 1992(in Chinese) [10] Cox D R. Prediction by exponentially weighted moving average and related methods[J]. Journal of the Royal Statistical Society,1961,23:414-412 [11] 孙静.自相关过程的自相关控制图[J]. 清华大学学报,2002,42(6):735-738 Sunjing. Residual charts for autocorrelated processes[J]. Journal of Tsinghua University, 2002,42(6):735-738(in Chinese)
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