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摘要:
针对胚胎电子细胞阵列中测试结构与故障检测和定位方法受电子细胞和阵列结构限制较大,故障检测和定位能力有限,硬件消耗大等问题,提出一种由可配置边界扫描结构和可配置内部扫描结构组成的新的测试结构。基于这种测试结构,提出了寄存器传输级故障检测和细胞级故障定位相结合的故障检测和定位方法。仿真实验以s27电路为例,详细介绍了故障检测和定位的具体过程并对测试结构的硬件消耗进行了分析。仿真和分析结果表明,本文方法可有效检测并在细胞级定位故障,而且随着阵列规模增大,测试结构的硬件消耗所占比例明显下降,适用于大规模胚胎电子细胞阵列。
Abstract:In embryonics array, testing architecture and the fault detection and location method are limited by the electronic cell structure and the array structure. Fault detection and location capability need to be improved, and the hardware consumption of the testing architecture is large. In order to solve these problems, a novel testing architecture composed of configurable boundary scan architecture and configurable inner scan architecture was proposed. Based on this novel architecture, a register transfer level fault detection method and a cell level fault location method were proposed. In the simulation of s27 circuit, the detailed process of fault detection and location is introduced, and the hardware resource consumption of the testing architecture is analyzed. Simulation and analysis results show that the proposed method can effectively detect and locate the fault at cell level, and the proportion of hardware resource consumption of the testing architecture decreases significantly as the size of the embryonics array increases, which is suitable for large-scale embryonics array.
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Key words:
- embryonics array /
- testing architecture /
- fault detection /
- fault location /
- scan test
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表 1 基因编码
Table 1. Gene code
基因功能 开关盒控制 LUT输入选择 输出控制 LUT功能 编码位置 36~25 24~17 16 15~0 表 2 基因库
Table 2. Gene bank
细胞坐标 细胞基因 (0, 0) 1FBE000000 (1, 0) 1EBE000000 (2, 0) 18EE138888 (3, 0) 14FE000000 (0, 1) 0F9E000000 (1, 1) 18DEC6EFCC (2, 1) 1B1DC2FFFB (3, 1) 0F761ABEBE (0, 2) 1F9A000000 (1, 2) 1F5C394F4F (2, 2) 07BC9D95C0 (3, 2) 07FA000000 (0, 3) 1FF2000000 (1, 3) 07FE000000 (2, 3) 1FF2000000 (3, 3) 0FFE000000 表 3 最小测试向量集
Table 3. Minimal test vector set
序号 测试向量 正常响应 可检测
故障数(I0, I1, I2, I3, D0, D1, D2) (D0, D1, D2, O) 1 (1, 0, 0, 1, 1, 0, 0) (0, 1, 0, 1) 16 2 (1, 1, 1, 0, 1, 1, 1) (0, 0, 1, 1) 8 3 (0, 0, 0, 0, 0, 0, 0) (0, 0, 0, 1) 9 4 (1, 0, 0, 1, 0, 1, 1) (0, 1, 0, 1) 3 5 (1, 0, 1, 1, 0, 0, 1) (0, 1, 0, 1) 4 6 (1, 0, 0, 1, 0, 0, 1) (0, 0, 1, 0) 12 7 (0, 0, 0, 0, 1, 0, 1) (1, 0, 1, 0) 2 表 4 测试数据
Table 4. Test data
扫描范围 数据 H1 01110000 H2 01111000 H3 00100110 V0 00000010 V1 01100010 V2 00010111 V3 01011110 V4 01000100 表 5 故障判断结果
Table 5. Fault diagnosis results
坐标 实际
输入实际
输出正常
响应d dn dr 判断
结果(0, 0) (1, 0, 0, ) (0, 0, 1, ) (0, 0, 1, 0) 正常 (1, 0) (1, 0, 1, ) (0, 0, 1, ) (0, 1, 1, 0) 故障 (2, 0) (1, 1, 0, ) (1, 0, 1, ) (1, 0, 1, 0) 1 0 0 正常 (3, 0) (1, 0, 0, ) (0, 1, 0, ) (0, 1, 0, 0) 正常 (0, 1) (0, 0, 0, 0) (0, 0, 0, 0) (0, 0, 0, 0) 正常 (1, 1) (0, 1, 1, 0) (0, 0, 0, 0) (0, 0, 0, 0) 正常 (2, 1) (0, 1, 1, 1) (1, 1, 1, 1) (1, 1, 1, 1) 正常 (3, 1) (1, 0, 1, 1) (1, 1, 0, 0) (1, 1, 0, 0) 正常 (0, 2) (0, 1, 0, 0) (0, 0, 1, 0) (0, 0, 1, 0) 正常 (1, 2) (1, 0, 1, 0) (0, 1, 0, 1) (0, 1, 0, 1) 1 1 1 正常 (2, 2) (0, 1, 1, 1) (1, 0, 0, 1) (1, 0, 0, 1) 1 0 0 正常 (3, 2) (0, 0, 0, 1) (1, 0, 0, 1) (1, 0, 0, 1) 正常 (0, 3) (0, ,1, 0) (0, ,0, 1) (0, 0, 0, 1) 正常 (1, 3) (0, ,0, 1) (1, ,0, 0) (1, 0, 0, 0) 正常 (2, 3) (0, ,1, 0) (0, ,0, 1) (0, 0, 0, 1) 正常 (3, 3) (0, ,1, 0) (1, ,0, 0) (1, 0, 0, 0) 正常 -
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