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Volume 41 Issue 10
Oct.  2015
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Journal of Beijing University of Aeronautics and Astronautics  > 2015  >  41(10): 1765-1776.
CHEN Kunshan, LI Zhaoliang, LIU Yuet al. Model analysis of bistatic scattering from randomly rough surfaces[J]. Journal of Beijing University of Aeronautics and Astronautics, 2015, 41(10): 1765-1776. doi: 10.13700/j.bh.1001-5965.2015.0205(in Chinese)
Citation: CHEN Kunshan, LI Zhaoliang, LIU Yuet al. Model analysis of bistatic scattering from randomly rough surfaces[J]. Journal of Beijing University of Aeronautics and Astronautics, 2015, 41(10): 1765-1776. doi: 10.13700/j.bh.1001-5965.2015.0205(in Chinese)
shu

Model analysis of bistatic scattering from randomly rough surfaces

doi: 10.13700/j.bh.1001-5965.2015.0205
  • 1.

    State Key Laboratory of Remote Sensing Science, Institute of Remote Sensing and Digital Earth, Chinese Academy of Science, Beijing 100101, China

  • 2. Key Laboratory of Agri-informatics, Ministry of Agriculture, Institute of Agricultural Resources and Regional Planning, Chinese Academy of Agricultural Sciences, Beijing 100081, China

  • Received Date: 09 Apr 2015
  • Rev Recd Date: 05 May 2015
  • Publish Date: 20 Oct 2015
    Abstract
  • Model analysis was presented of bistatic scattering features from randomly rough surfaces theoretically. In particular, a statistical advanced integral equation model (AIEM) was selected as the working model. The scattering coefficients in the location of the dip in azimuthal plane were investigated for different roughness scale. Theoretical predictions of scattering coefficients were illustrated, demonstrated, and validated by comparisons with numerical simulations, and measurements. The results show that the dip location or region is both rough and polarization dependent. Simulation results offer deeper physical insights into the scattering features of statistically rough surface and thus are useful or even vital for designing future and yet more effective bistatic measurement configurations.

     

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