| Citation: | ZHANG Jingyuan, HE Yuzhu, CUI Weijiaet al. Reliability life prediction of smart meter based on multi-stress degradation model[J]. Journal of Beijing University of Aeronautics and Astronautics, 2017, 43(8): 1662-1669. doi: 10.13700/j.bh.1001-5965.2016.0582(in Chinese)
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Aimed at the difficulty to accurately predict the reliability life of smart meter in running state, based on the generalized multi-stress accelerated model, this study researched and determined the life distribution rules of smart meter by using the accelerated degradation test data. Through the analysis of the relationship between the environment stress and the parameters of Weibull distribution model, a new multi-stress degradation model based on log-linear regression model was established, parameters correction method of the new model was proposed, the solution of the parameters of life distribution model was realized, and the prediction consequence of the reliability life and remaining life of smart meter under normal stress level was obtained. The normal stress condition is set up at the end of the paper, and the feasibility of the method is verified, so that a research method is provided for the reliability life assessment of smart meter.
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