| Citation: | FU C S，YAN Z W，SU D L. Research on broadband and high flatness conductive electromagnetic susceptibility injection probe[J]. Journal of Beijing University of Aeronautics and Astronautics，2023，49（11）：3000-3009 （in Chinese） doi: 10.13700/j.bh.1001-5965.2022.0015
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The development trend of small volume, high density, and high clock frequency of integrated circuits and electronic equipment leads to serious electromagnetic compatibility problems, especially electromagnetic susceptibility problems. The electromagnetic susceptibility level of integrated circuits and electronic equipment is very important for their optimal design, and broadband pulse injection probes are widely used in the conducted electromagnetic susceptibility test of integrated circuits and electronic equipment. The project design of broadband pulse injection probes with broadband and high flatness is put into effect by examining the operating principle of broadband pulse injection probes and the variables affecting working bandwidth and flatness on the basis of he conducted electromagnetic susceptibility test requirements of integrated circuits and electronic equipment. A broadband pulse injection probe with a broad frequency band and high flatness is produced using the techniques of multi-wire parallel winding, matching design of magnetic core and shell, and impedance matching in high-frequency band.The test results and practical application results show that the designed broadband pulse injection probe achieves the performance index of working frequency covering 9 kHz-1 GHz and flatness less than 5 dB, and can also meet the needs of conducting electromagnetic susceptibility tests.
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